Chin. J. Semicond. > 2002, Volume 23 > Issue 4 > 403-407
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手机用砷化镓双刀双掷单片射频开关成品率分析

李拂晓 , 蒋幼泉 , 吴振海 , 徐中仓 , 钮利荣 , 周剑明 , 邵凯 and 杨乃彬

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Key words: 砷化镓, 单片, 射频开关, 成品率分析

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    Received: 19 August 2015 Revised: Online: Published: 01 April 2002

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      Article Navigation >  Journal of Semiconductors  > 2002  >  23(4): 403-407
      李拂晓, 蒋幼泉, 吴振海, 徐中仓, 钮利荣, 周剑明, 邵凯, 杨乃彬. 手机用砷化镓双刀双掷单片射频开关成品率分析[J]. 半导体学报(英文版), 2002, 23(4): 403-407.
      Citation:
      李拂晓, 蒋幼泉, 吴振海, 徐中仓, 钮利荣, 周剑明, 邵凯, 杨乃彬. 手机用砷化镓双刀双掷单片射频开关成品率分析[J]. 半导体学报(英文版), 2002, 23(4): 403-407.
      shu

      • Received Date: 2015-08-19

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