Chin. J. Semicond. > 1980, Volume 1 > Issue 1 > 65-75
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GaAs MESFET外延层中载流子浓度分布及漂移迁移率分布的实验测定

张友渝

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    Received: 20 August 2015 Revised: Online: Published: 01 January 1980

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      Article Navigation >  Journal of Semiconductors  > 1980  >  1(1): 65-75
      张友渝. GaAs MESFET外延层中载流子浓度分布及漂移迁移率分布的实验测定[J]. 半导体学报(英文版), 1980, 1(1): 65-75.
      Citation:
      张友渝. GaAs MESFET外延层中载流子浓度分布及漂移迁移率分布的实验测定[J]. 半导体学报(英文版), 1980, 1(1): 65-75.
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      • Received Date: 2015-08-20

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