Chin. J. Semicond. > 2005, Volume 26 > Issue 2 > 271-275

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Abstract: A novel bonding method using silicate gel as bonding medium is developed.High reflective SiO2/Si mirrors deposited on silicon substrates by e-beam deposition are bonded to the active layers at a low temperature of 350℃ without any special treatment on bonding surfaces.The reflectivities of the mirrors can be as high as 99.9%.A Si.based narrow band response InGaAs photodetector is successfully fabricated,with a quantum efficiency of 22.6% at the peak wavelength of 1.54μm,and a full width at half maximum of about 27nm.This method has a great potential for industry processes.

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    Received: 19 August 2015 Revised: Online: Published: 01 February 2005

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      Mao Rongwei, Zuo Yuhua, Li Chuanbo, Cheng Buwen, Teng Xuegong, Luo Liping, Zhang Heshun, Yu Jinzhong,and Wang Qiming. Fabrication of 1.55μm Si-Based Resonant Cavity Enhanced Photodetectors[J]. Journal of Semiconductors, 2005, 26(2): 271-275. ****Fabrication of 1.55μm Si-Based Resonant Cavity Enhanced Photodetectors[J]. Chin. J. Semicond., 2005, 26(2): 271.
      Citation:
      Mao Rongwei, Zuo Yuhua, Li Chuanbo, Cheng Buwen, Teng Xuegong, Luo Liping, Zhang Heshun, Yu Jinzhong,and Wang Qiming. Fabrication of 1.55μm Si-Based Resonant Cavity Enhanced Photodetectors[J]. Journal of Semiconductors, 2005, 26(2): 271-275. ****
      Fabrication of 1.55μm Si-Based Resonant Cavity Enhanced Photodetectors[J]. Chin. J. Semicond., 2005, 26(2): 271.

      Fabrication of 1.55μm Si-Based Resonant Cavity Enhanced Photodetectors

      • Received Date: 2015-08-19

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