Citation: |
张瑞勤, 吴汲安, 邢益荣. Si(112)高密勒指数面的理论研究[J]. 半导体学报(英文版), 1993, 14(9): 527-533.
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Received: 20 August 2015 Revised: Online: Published: 01 September 1993
Citation: |
张瑞勤, 吴汲安, 邢益荣. Si(112)高密勒指数面的理论研究[J]. 半导体学报(英文版), 1993, 14(9): 527-533.
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