Chin. J. Semicond. > 1993, Volume 14 > Issue 9 > 527-533

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    Received: 20 August 2015 Revised: Online: Published: 01 September 1993

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      张瑞勤, 吴汲安, 邢益荣. Si(112)高密勒指数面的理论研究[J]. 半导体学报(英文版), 1993, 14(9): 527-533.
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      张瑞勤, 吴汲安, 邢益荣. Si(112)高密勒指数面的理论研究[J]. 半导体学报(英文版), 1993, 14(9): 527-533.

      • Received Date: 2015-08-20

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