Citation: |
Chih-Tang Sah, Bin B. Jie. Bipolar Theory of MOS Field-Effect Transistors and Experiments[J]. Journal of Semiconductors, 2007, 28(10): 1497-1502.
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Chih-Tang S, Bin B. Jie. Bipolar Theory of MOS Field-Effect Transistors and Experiments[J]. Chin. J. Semicond., 2007, 28(10): 1497.
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Bipolar Theory of MOS Field-Effect Transistors and Experiments
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Abstract
The bipolar theory of fieldeffect transistor is introduced to replace the 55-year-old classic unipolar theory invented by Shockley in 1952 in order to account for the characteristics observed in recent double-gate nanometer silicon MOS field-effect transistors.Two electron and two hole surface channels are simultaneously present in all channel current ranges.Output and transfer characteristics are computed over practical base and gate oxide thicknesses.The bipolar theory corroborates well with experimental data reported recently for FinFETs with metal/silicon and p/n junction source/drain contacts.Singledevice realization of CMOS inverter and SRAM memory circuit functions are recognized. -
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