Chin. J. Semicond. > 1985, Volume 6 > Issue 2 > 221-224

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评“K_(CMR)的一个测试方法”

易明銧

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    Received: 20 August 2015 Revised: Online: Published: 01 February 1985

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      Article Navigation >  Journal of Semiconductors  > 1985  >  6(2): 221-224
      易明銧. 评“K_(CMR)的一个测试方法”[J]. 半导体学报(英文版), 1985, 6(2): 221-224.
      Citation:
      易明銧. 评“K_(CMR)的一个测试方法”[J]. 半导体学报(英文版), 1985, 6(2): 221-224.
      shu

      • Received Date: 2015-08-20

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