Chin. J. Semicond. > 2000, Volume 21 > Issue 6 > 620-624

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用扫描热显微镜测量亚微米尺度的局域热参数分布

谢志刚 , 韩立 , 董占民 , 王秀凤 , 陈皓明 , 顾毓沁 and 晋宏师

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Key words: 扫描热显微镜, 热参数, 热桥, 半导体激光器

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    Received: 20 August 2015 Revised: Online: Published: 01 June 2000

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      Article Navigation >  Journal of Semiconductors  > 2000  >  21(6): 620-624
      谢志刚, 韩立, 董占民, 王秀凤, 陈皓明, 顾毓沁, 晋宏师. 用扫描热显微镜测量亚微米尺度的局域热参数分布[J]. 半导体学报(英文版), 2000, 21(6): 620-624.
      Citation:
      谢志刚, 韩立, 董占民, 王秀凤, 陈皓明, 顾毓沁, 晋宏师. 用扫描热显微镜测量亚微米尺度的局域热参数分布[J]. 半导体学报(英文版), 2000, 21(6): 620-624.
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      • Received Date: 2015-08-20

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