Chin. J. Semicond. > 2003, Volume 24 > Issue 5 > 461-465
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薄膜SOI温度传感器中的少数载流子排斥效应(英文)

李斌 , 黎沛涛 , 刘百勇 and 郑学仁

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Key words: 少数载流子排斥效应, 高温传感器, 扩展电阻, SOI

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    Received: 20 August 2015 Revised: Online: Published: 01 May 2003

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      Article Navigation >  Journal of Semiconductors  > 2003  >  24(5): 461-465
      李斌, 黎沛涛, 刘百勇, 郑学仁. 薄膜SOI温度传感器中的少数载流子排斥效应(英文)[J]. 半导体学报(英文版), 2003, 24(5): 461-465.
      Citation:
      李斌, 黎沛涛, 刘百勇, 郑学仁. 薄膜SOI温度传感器中的少数载流子排斥效应(英文)[J]. 半导体学报(英文版), 2003, 24(5): 461-465.
      shu

      • Received Date: 2015-08-20

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