Chin. J. Semicond. > 2002, Volume 23 > Issue 12 > 1295-1297
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发光二极管外延片质量控制的新方法

苏哲 , 董占民 , 韩立 and 陈浩明

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Key words: 外延片, 光致发光, 无损检测

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    Received: 19 August 2015 Revised: Online: Published: 01 December 2002

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      Article Navigation >  Journal of Semiconductors  > 2002  >  23(12): 1295-1297
      苏哲, 董占民, 韩立, 陈浩明. 发光二极管外延片质量控制的新方法[J]. 半导体学报(英文版), 2002, 23(12): 1295-1297.
      Citation:
      苏哲, 董占民, 韩立, 陈浩明. 发光二极管外延片质量控制的新方法[J]. 半导体学报(英文版), 2002, 23(12): 1295-1297.
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      • Received Date: 2015-08-19

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