Chin. J. Semicond. > 1991, Volume 12 > Issue 7 > 430-434
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Al_xGa_(1-x)As的俄歇电子谱定量分析

杨得全 and 范垂祯

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    Received: 19 August 2015 Revised: Online: Published: 01 July 1991

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      Article Navigation >  Journal of Semiconductors  > 1991  >  12(7): 430-434
      杨得全, 范垂祯. Al_xGa_(1-x)As的俄歇电子谱定量分析[J]. 半导体学报(英文版), 1991, 12(7): 430-434.
      Citation:
      杨得全, 范垂祯. Al_xGa_(1-x)As的俄歇电子谱定量分析[J]. 半导体学报(英文版), 1991, 12(7): 430-434.
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      • Received Date: 2015-08-19

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