Chin. J. Semicond. > 1993, Volume 14 > Issue 7 > 429-433
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InGaAsP/InP外延薄膜折射率与厚度测量

刘永智 , 余般枚 and 边红

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    Received: 20 August 2015 Revised: Online: Published: 01 July 1993

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      Article Navigation >  Journal of Semiconductors  > 1993  >  14(7): 429-433
      刘永智, 余般枚, 边红. InGaAsP/InP外延薄膜折射率与厚度测量[J]. 半导体学报(英文版), 1993, 14(7): 429-433.
      Citation:
      刘永智, 余般枚, 边红. InGaAsP/InP外延薄膜折射率与厚度测量[J]. 半导体学报(英文版), 1993, 14(7): 429-433.
      shu

      • Received Date: 2015-08-20

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