Chin. J. Semicond. > 2000, Volume 21 > Issue 8 > 816-821
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基于可靠性及噪声约束的电源/地线优化设计

李春辉 , 范明钰 , 庄昌文 , 虞厥邦 and 黄劲

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Key words: 优化设计, 电源线/地线, 可靠性, 噪声约束

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    Received: 20 August 2015 Revised: Online: Published: 01 August 2000

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      Article Navigation >  Journal of Semiconductors  > 2000  >  21(8): 816-821
      李春辉, 范明钰, 庄昌文, 虞厥邦, 黄劲. 基于可靠性及噪声约束的电源/地线优化设计[J]. 半导体学报(英文版), 2000, 21(8): 816-821.
      Citation:
      李春辉, 范明钰, 庄昌文, 虞厥邦, 黄劲. 基于可靠性及噪声约束的电源/地线优化设计[J]. 半导体学报(英文版), 2000, 21(8): 816-821.
      shu

      • Received Date: 2015-08-20

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