Chin. J. Semicond. > 1984, Volume 5 > Issue 2 > 217-220
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氧化铅靶层形貌、取向和晶粒度的观测

陆颖 , 王朝果 and 葛玉如

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    Received: 19 August 2015 Revised: Online: Published: 01 February 1984

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      Article Navigation >  Journal of Semiconductors  > 1984  >  5(2): 217-220
      陆颖, 王朝果, 葛玉如. 氧化铅靶层形貌、取向和晶粒度的观测[J]. 半导体学报(英文版), 1984, 5(2): 217-220.
      Citation:
      陆颖, 王朝果, 葛玉如. 氧化铅靶层形貌、取向和晶粒度的观测[J]. 半导体学报(英文版), 1984, 5(2): 217-220.
      shu

      • Received Date: 2015-08-19

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