Chin. J. Semicond. > 2001, Volume 22 > Issue 3 > 340-344
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基于MOSFET比例差值特性的器件表征方法

王金延 , 许铭真 and 谭长华

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Key words: MOS器件表征, 比例差值, 输出特性

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    Received: 20 August 2015 Revised: Online: Published: 01 March 2001

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      Article Navigation >  Journal of Semiconductors  > 2001  >  22(3): 340-344
      王金延, 许铭真, 谭长华. 基于MOSFET比例差值特性的器件表征方法[J]. 半导体学报(英文版), 2001, 22(3): 340-344.
      Citation:
      王金延, 许铭真, 谭长华. 基于MOSFET比例差值特性的器件表征方法[J]. 半导体学报(英文版), 2001, 22(3): 340-344.
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      • Received Date: 2015-08-20

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