Chin. J. Semicond. > 1984, Volume 5 > Issue 1 > 81-87
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用背散射实验技术分析Pt/GaAs接触界面

谢葆珍 , 刘世杰 , 张敬平 , 殷士端 , 顾诠 and 戴爱平

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    Received: 20 August 2015 Revised: Online: Published: 01 January 1984

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      Article Navigation >  Journal of Semiconductors  > 1984  >  5(1): 81-87
      谢葆珍, 刘世杰, 张敬平, 殷士端, 顾诠, 戴爱平. 用背散射实验技术分析Pt/GaAs接触界面[J]. 半导体学报(英文版), 1984, 5(1): 81-87.
      Citation:
      谢葆珍, 刘世杰, 张敬平, 殷士端, 顾诠, 戴爱平. 用背散射实验技术分析Pt/GaAs接触界面[J]. 半导体学报(英文版), 1984, 5(1): 81-87.
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      • Received Date: 2015-08-20

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