Chin. J. Semicond. > 1993, Volume 14 > Issue 11 > 712-714
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蓝宝石上硅膜(SOS)肖特基结注入电流检测的电子自旋共振及Si/Al_2O_3界面缺陷

傅济时 , 吴恩 , 秦国刚 , 朱美栋 and 郁元桓

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    Received: 20 August 2015 Revised: Online: Published: 01 November 1993

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      Article Navigation >  Journal of Semiconductors  > 1993  >  14(11): 712-714
      傅济时, 吴恩, 秦国刚, 朱美栋, 郁元桓. 蓝宝石上硅膜(SOS)肖特基结注入电流检测的电子自旋共振及Si/Al_2O_3界面缺陷[J]. 半导体学报(英文版), 1993, 14(11): 712-714.
      Citation:
      傅济时, 吴恩, 秦国刚, 朱美栋, 郁元桓. 蓝宝石上硅膜(SOS)肖特基结注入电流检测的电子自旋共振及Si/Al_2O_3界面缺陷[J]. 半导体学报(英文版), 1993, 14(11): 712-714.
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      • Received Date: 2015-08-20

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