Citation: |
Liu Jun, Sun Lingling. Parameter Extraction of a III-V Compound HBT Model[J]. Journal of Semiconductors, 2006, 27(5): 874-880.
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Liu J, Sun L L. Parameter Extraction of a III-V Compound HBT Model[J]. Chin. J. Semicond., 2006, 27(5): 874.
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Parameter Extraction of a III-V Compound HBT Model
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Abstract
Novel equations in terms of the current of the intrinsic collector and emitter are implemented to improve the fitting ability of a III-V compound HBT model.An equivalent circuit for the HBT under zero- and cold-bias conditions is proposed for the extraction of access resistances and parasitic inductances.In order to determine the intrinsic and extrinsic parts of the base-emitter,base-collector junction capacitances accurately,a novel direct parameter-extraction method based on "cold-bias" S-measurements is developed.After directly extracting the intrinsic collector resistance Rci,this method describes how to extract the intrinsic and extrinsic capacitances from different "cold bias" points.Experimental validation on a GaAs HBT device with a 180μm2 emitter is carried out,and excellent results are obtained up to 40GHz. -
References
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