Chin. J. Semicond. > 1980, Volume 1 > Issue 1 > 16-25
|

CONTENTS

用简并双模腔测量微波霍耳迁移率

魏策军 , Dr.W.Bauhofer , 周洁 and 张执中

+ Author Affiliations

PDF

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 5950 Times PDF downloads: 2236 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: Online: Published: 01 January 1980

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 1980  >  1(1): 16-25
      魏策军, Dr.W.Bauhofer, 周洁, 张执中. 用简并双模腔测量微波霍耳迁移率[J]. 半导体学报(英文版), 1980, 1(1): 16-25.
      Citation:
      魏策军, Dr.W.Bauhofer, 周洁, 张执中. 用简并双模腔测量微波霍耳迁移率[J]. 半导体学报(英文版), 1980, 1(1): 16-25.
      shu

      • Received Date: 2015-08-20

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return