Chin. J. Semicond. > 1985, Volume 6 > Issue 2 > 181-184
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光电化学法测量GaAlAs/GaAs多层结构材料中Al组分分布

陈自姚 , 邵永富 , 朱福英 and 彭瑞伍

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    Received: 20 August 2015 Revised: Online: Published: 01 February 1985

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      Article Navigation >  Journal of Semiconductors  > 1985  >  6(2): 181-184
      陈自姚, 邵永富, 朱福英, 彭瑞伍. 光电化学法测量GaAlAs/GaAs多层结构材料中Al组分分布[J]. 半导体学报(英文版), 1985, 6(2): 181-184.
      Citation:
      陈自姚, 邵永富, 朱福英, 彭瑞伍. 光电化学法测量GaAlAs/GaAs多层结构材料中Al组分分布[J]. 半导体学报(英文版), 1985, 6(2): 181-184.
      shu

      • Received Date: 2015-08-20

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