J. Semicond. > Volume 32 > Issue 11 > Article Number: 115005

Noise in a CMOS digital pixel sensor

Zhang Chi , Yao Suying and Xu Jiangtao

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Abstract: Based on the study of noise performance in CMOS digital pixel sensor (DPS), a mathematical model of noise is established with the pulse-width-modulation (PWM) principle. Compared with traditional CMOS image sensors, the integration time is different and A/D conversion is implemented in each PWM DPS pixel. Then, the quantitative calculating formula of system noise is derived. It is found that dark current shot noise is the dominant noise source in low light region while photodiode shot noise becomes significantly important in the bright region. In this model, photodiode shot noise does not vary with luminance, but dark current shot noise does. According to increasing photodiode capacitance and the comparator's reference voltage or optimizing the mismatch in the comparator, the total noise can be reduced. These results serve as a guideline for the design of PWM DPS.

Key words: CMOS image sensordigital pixel sensorrandom noisepattern noise



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Zhang C, Yao S Y, Xu J T. Noise in a CMOS digital pixel sensor[J]. J. Semicond., 2011, 32(11): 115005. doi: 10.1088/1674-4926/32/11/115005.

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Manuscript received: 20 August 2015 Manuscript revised: 23 June 2011 Online: Published: 01 November 2011

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