史志强 , 刘克源 , 王学恩 , 刘兴胜 and 杨子强
Abstract: 在室温下测量了掺氧非晶硅薄膜的正电子寿命谱.实验发现,随着掺氧量的增加,正电子寿命减小,对应的相对强度增加.据此,本文从电子密度、悬挂键和微空洞等方面讨论了氧掺杂对非晶硅薄膜微观结构的影响.
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Manuscript received: 19 August 2015 Manuscript revised: Online: Published: 01 November 1997
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