Chin. J. Semicond. > Volume 12 > Issue 3 > Article Number: 188

Ge/Si超晶格喇曼谱研究

金鹰 , 张树霖 , 秦国刚 , 盛篪 and 周铁城

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Abstract: 我们用喇曼光散射的方法,观察了应变层超晶格的折迭声学声子,从而验证了材料的超晶格多层结构.将实验中观察到的频率和理论计算值进行比较表明,所研究样品的标称值和喇曼实验是基本相符合的.根据光学限制模的频率移动,估算了超晶格样品中Ge层和Si层的应变分布.

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History

Manuscript received: 19 August 2015 Manuscript revised: Online: Published: 01 March 1991

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