2019年JOS入选“中国科技期刊卓越行动计划”

2020年11月JOS被EI数据库收录

Chin. J. Semicond. > Volume 4 > Issue 2 > Article Number: 194

Previous Article

|

用光吸收法测量半绝缘GaAs中Cr浓度的定标曲线

许振嘉 , 张泽华 and 孙伯康

+ Author Affiliations + Find other works by these authors

Abstract: 利用中子活化法作定标,建立了用红外吸收法测量半绝缘GaAs中Cr浓度的定标曲线,并讨论了该曲线的应用范围.

Search

Share:

Article Metrics

Article views: 1689 Times PDF downloads: 1118 Times Cited by: 0 Times

History

Manuscript received: 20 August 2015 Manuscript revised: Online: Published: 01 February 1983

Journal of Semiconductors © 2017 All Rights Reserved 京ICP备05085259号-2