J. Semicond. > 2011, Volume 32 > Issue 11 > 114003

SEMICONDUCTOR DEVICES

A novel high voltage LIGBT with an n-region in p-substrate

Cheng Jianbing, Zhang Bo and Li Zhaoji

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DOI: 10.1088/1674-4926/32/11/114003

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Abstract: A novel 4 μm thickness drift region lateral insulated gate bipolar transistor with a floating n-region (NR-LIGBT) in p-substrate is proposed. Due to the field modulation from the n-region, the vertical blocking capability is enhanced and the breakdown voltage is improved significantly. Low area cost, high current capability and short turn-off time are achieved because of the high average electric field per micron. Simulation results show that the blocking capability of the new LIGBT increases by about 58% when compared with the conventional LIGBT (C-LIGBT) for the same 100 μm drift region length. Furthermore, the turn-off time is shorter than that of the conventional LIGBT for nearly same blocking capability.

Key words: NR-LIGBT

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    Received: 20 August 2015 Revised: 18 July 2011 Online: Published: 01 November 2011

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      Cheng Jianbing, Zhang Bo, Li Zhaoji. A novel high voltage LIGBT with an n-region in p-substrate[J]. Journal of Semiconductors, 2011, 32(11): 114003. doi: 10.1088/1674-4926/32/11/114003 ****Cheng J B, Zhang B, Li Z J. A novel high voltage LIGBT with an n-region in p-substrate[J]. J. Semicond., 2011, 32(11): 114003. doi: 10.1088/1674-4926/32/11/114003.
      Citation:
      Cheng Jianbing, Zhang Bo, Li Zhaoji. A novel high voltage LIGBT with an n-region in p-substrate[J]. Journal of Semiconductors, 2011, 32(11): 114003. doi: 10.1088/1674-4926/32/11/114003 ****
      Cheng J B, Zhang B, Li Z J. A novel high voltage LIGBT with an n-region in p-substrate[J]. J. Semicond., 2011, 32(11): 114003. doi: 10.1088/1674-4926/32/11/114003.

      A novel high voltage LIGBT with an n-region in p-substrate

      DOI: 10.1088/1674-4926/32/11/114003
      • Received Date: 2015-08-20
      • Accepted Date: 2011-05-03
      • Revised Date: 2011-07-18
      • Published Date: 2011-10-20

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