1 |
Mathematical analysis of organic-pass transistor using pseudo-p-OTFTs
Shagun Pal, Brijesh Kumar
Journal of Semiconductors, 2020, 41(6): 062601. doi: 10.1088/1674-4926/41/6/062601
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2 |
An advanced SEU tolerant latch based on error detection
Hui Xu, Jianwei Zhu, Xiaoping Lu, Jingzhao Li
Journal of Semiconductors, 2018, 39(5): 055003. doi: 10.1088/1674-4926/39/5/055003
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3 |
Detection of lead ions with AlGaAs/InGaAs pseudomorphic high electron mobility transistor
Jiqiang Niu, Yang Zhang, Min Guan, Chengyan Wang, Lijie Cui, et al.
Journal of Semiconductors, 2016, 37(11): 114003. doi: 10.1088/1674-4926/37/11/114003
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4 |
Predictions for proton and heavy ions induced SEUs in 65 nm SRAMs
Shougang Du, Suge Yue, Hongxia Liu, Long Fan, Hongcao Zheng, et al.
Journal of Semiconductors, 2015, 36(11): 114010. doi: 10.1088/1674-4926/36/11/114010
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5 |
Multi-bits error detection and fast recovery in RISC cores
Jing Wang, Xing Yang, Yuanfu Zhao, Weigong Zhang, Jiao Shen, et al.
Journal of Semiconductors, 2015, 36(11): 115009. doi: 10.1088/1674-4926/36/11/115009
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6 |
Single event soft error in advanced integrated circuit
Yuanfu Zhao, Suge Yue, Xinyuan Zhao, Shijin Lu, Qiang Bian, et al.
Journal of Semiconductors, 2015, 36(11): 111001. doi: 10.1088/1674-4926/36/11/111001
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7 |
Simulation and research on a 4T-cell based duplication redundancy SRAM for SEU radiation hardening
Xinhong Hong, Liyang Pan, Wendi Zhang, Dongmei Ji, Dong Wu, et al.
Journal of Semiconductors, 2015, 36(11): 114003. doi: 10.1088/1674-4926/36/11/114003
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8 |
A 6-bit 4 GS/s pseudo-thermometer segmented CMOS DAC
Yijun Song, Wenyuan Li
Journal of Semiconductors, 2014, 35(6): 065007. doi: 10.1088/1674-4926/35/6/065007
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9 |
Laser SEU sensitivity mapping of deep submicron CMOS SRAM
Yongtao Yu, Guoqiang Feng, Rui Chen, Jianwei Han
Journal of Semiconductors, 2014, 35(6): 064011. doi: 10.1088/1674-4926/35/6/064011
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10 |
A 130 nm radiation hardened flip-flop with an annular gate and a C-element
Lei Wang, Jianhua Jiang, Yiming Xiang, Yumei Zhou
Journal of Semiconductors, 2014, 35(1): 015010. doi: 10.1088/1674-4926/35/1/015010
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11 |
An SEU-hardened latch with a triple-interlocked structure
Li Yuanqing, Yao Suying, Xu Jiangtao, Gao Jing
Journal of Semiconductors, 2012, 33(8): 085002. doi: 10.1088/1674-4926/33/8/085002
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12 |
SEE characteristics of small feature size devices by using laser backside testing
Feng Guoqiang, Shangguan Shipeng, Ma Yingqi, Han Jianwei
Journal of Semiconductors, 2012, 33(1): 014008. doi: 10.1088/1674-4926/33/1/014008
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13 |
A pseudo differential Gm–C complex filter with frequency tuning for IEEE802.15.4 applications
Cheng Xin, Zhong Lungui, Yang Haigang, Liu Fei, Gao Tongqiang, et al.
Journal of Semiconductors, 2011, 32(7): 075005. doi: 10.1088/1674-4926/32/7/075005
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14 |
A software solution to estimate the SEU-induced soft error rate for systems implemented on SRAM-based FPGAs
Wang Zhongming, Yao Zhibin, Guo Hongxia, Lü Min
Journal of Semiconductors, 2011, 32(5): 055008. doi: 10.1088/1674-4926/32/5/055008
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15 |
A PWM/Pseudo-PFM Auto-Mode-Applied Buck DC/DC Switching Regulator
Liu Lianxi, Yang Yintang, Zhu Zhangming
Journal of Semiconductors, 2008, 29(10): 1956-1962.
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16 |
Multiple Node Upset in SEU Hardened Storage Cells
Liu Biwei, Hao Yue, Chen Shuming
Journal of Semiconductors, 2008, 29(2): 244-250.
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17 |
Circuit Simulation of SEU for SRAM Cells
Liu Zheng, Sun Yongjie, Li Shaoqing, Liang Bin
Chinese Journal of Semiconductors , 2007, 28(1): 138-141.
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18 |
A Novel Low Power SEU Hardened Storage Cell
Liu Biwei, Chen Shuming, Liang Bin
Chinese Journal of Semiconductors , 2007, 28(5): 755-758.
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19 |
SOI Device Design for SEU Hardening
He Wei, Zhang Zhengxuan
Chinese Journal of Semiconductors , 2006, 27(S1): 291-294.
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