J. Semicond. > 2011, Volume 32 > Issue 9 > 094009

SEMICONDUCTOR DEVICES

Built-in electric field thickness design for betavoltaic batteries

Chen Haiyang, Li Darang, Yin Jianhua and Cai Shengguo

+ Author Affiliations
DOI: 10.1088/1674-4926/32/9/094009

PDF

Abstract: Isotope source energy deposition along the thickness direction of a semiconductor is calculated, based upon which an ideal short current is evaluated for betavoltaic batteries. Electron-hole pair recombination and drifting length in a PN junction built-in electric field are extracted by comparing the measured short currents with the ideal short currents. A built-in electric field thickness design principle is proposed for betavoltaic batteries: after measuring the energy deposition depth and the carrier drift length, the shorter one should then be chosen as the built-in electric field thickness. If the energy deposition depth is much larger than the carrier drift length, a multijunction is preferred in betavoltaic batteries and the number of the junctions should be the value of the deposition depth divided by the drift length.

Key words: betavoltaic batterybuilt-in electric fieldelectron-hole pair recombinationenergy deposition

[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
[9]
[10]
[11]
[12]
[13]
1

Hybrid functional microfibers for textile electronics and biosensors

Bichitra Nanda Sahoo, Byungwoo Choi, Jungmok Seo, Taeyoon Lee

Journal of Semiconductors, 2018, 39(1): 011009. doi: 10.1088/1674-4926/39/1/011009

2

Engineering in-plane silicon nanowire springs for highly stretchable electronics

Zhaoguo Xue, Taige Dong, Zhimin Zhu, Yaolong Zhao, Ying Sun, et al.

Journal of Semiconductors, 2018, 39(1): 011001. doi: 10.1088/1674-4926/39/1/011001

3

Materials and applications of bioresorbable electronics

Xian Huang

Journal of Semiconductors, 2018, 39(1): 011003. doi: 10.1088/1674-4926/39/1/011003

4

Donor impurity-related optical absorption coefficients and refractive index changes in a rectangular GaAs quantum dot in the presence of electric field

Sheng Wang, Yun Kang, Xianli Li

Journal of Semiconductors, 2016, 37(11): 112001. doi: 10.1088/1674-4926/37/11/112001

5

Effect of electric field on metallic SWCNT interconnects for nanoscale technologies

Harsimran Kaur, Karamjit Singh Sandha

Journal of Semiconductors, 2015, 36(3): 035001. doi: 10.1088/1674-4926/36/3/035001

6

Comment on Chen et al. "Fabrication and photovoltaic conversion enhancement of graphene/n-Si Schottky barrier solar cells by electrophoretic deposition", Electrochimica Acta, 2014

Lara Valentic, Nima E. Gorji

Journal of Semiconductors, 2015, 36(9): 094012. doi: 10.1088/1674-4926/36/9/094012

7

Effect of band gap energy on the electrical conductivity in doped ZnO thin film

Said Benramache, Okba Belahssen, Hachemi Ben Temam

Journal of Semiconductors, 2014, 35(7): 073001. doi: 10.1088/1674-4926/35/7/073001

8

In situ TEM/SEM electronic/mechanical characterization of nano material with MEMS chip

Yuelin Wang, Tie Li, Xiao Zhang, Hongjiang Zeng, Qinhua Jin, et al.

Journal of Semiconductors, 2014, 35(8): 081001. doi: 10.1088/1674-4926/35/8/081001

9

A novel DTSCR with a variation lateral base doping structure to improve turn-on speed for ESD protection

Jizhi Liu, Zhiwei Liu, Ze Jia, Juin. J Liou

Journal of Semiconductors, 2014, 35(6): 064010. doi: 10.1088/1674-4926/35/6/064010

10

The influence of the channel electric field distribution on the polarization Coulomb field scattering in AlN/GaN heterostructure field-effect transistors

Yingxia Yu, Zhaojun Lin, Yuanjie Lü, Zhihong Feng, Chongbiao Luan, et al.

Journal of Semiconductors, 2014, 35(12): 124007. doi: 10.1088/1674-4926/35/12/124007

11

Structural parameters improvement of an integrated HBT in a cascode configuration opto-electronic mixer

Hassan Kaatuzian, Hadi Dehghan Nayeri, Masoud Ataei, Ashkan Zandi

Journal of Semiconductors, 2013, 34(9): 094001. doi: 10.1088/1674-4926/34/9/094001

12

AC-electronic and dielectric properties of semiconducting phthalocyanine compounds:a comparative study

Safa'a M. Hraibat, Rushdi M-L. Kitaneh, Mohammad M. Abu-Samreh, Abdelkarim M. Saleh

Journal of Semiconductors, 2013, 34(11): 112001. doi: 10.1088/1674-4926/34/11/112001

13

Correlation between electrical conductivity-optical band gap energy and precursor molarities ultrasonic spray deposition of ZnO thin films

Said Benramache, Okba Belahssen, Abderrazak Guettaf, Ali Arif

Journal of Semiconductors, 2013, 34(11): 113001. doi: 10.1088/1674-4926/34/11/113001

14

Dielectric response and electric properties of organic semiconducting phthalocyanine thin films

A. M. Saleh, S. M. Hraibat, R. M-L. Kitaneh, M. M. Abu-Samreh, S. M. Musameh, et al.

Journal of Semiconductors, 2012, 33(8): 082002. doi: 10.1088/1674-4926/33/8/082002

15

Atomic layer deposition of an Al2O3 dielectric on ultrathin graphite by using electron beam irradiation

Jiang Ran, Meng Lingguo, Zhang Xijian, Hyung-Suk Jung, Cheol Seong Hwang, et al.

Journal of Semiconductors, 2012, 33(9): 093004. doi: 10.1088/1674-4926/33/9/093004

16

Optical and electrical properties of electrochemically deposited polyaniline-CeO2 hybrid nanocomposite film

Anees A. Ansari, M. A. M. Khan, M. Naziruddin Khan, Salman A. Alrokayan, M. Alhoshan, et al.

Journal of Semiconductors, 2011, 32(4): 043001. doi: 10.1088/1674-4926/32/4/043001

17

Photoconductive properties of lead iodide films prepared by electron beam evaporation

Zhu Xinghua, Yang Dingyu, Wei Zhaorong, Sun Hui, Wang Zhiguo, et al.

Journal of Semiconductors, 2010, 31(8): 083002. doi: 10.1088/1674-4926/31/8/083002

18

Electron Injection Enhancement by Diamond-Like Carbon Film in Polymer Electroluminescence Devices

Li Hongjian, Yan Lingling, Huang Baiyun, Yi Danqing, Hu Jin, et al.

Chinese Journal of Semiconductors , 2006, 27(1): 30-34.

19

Influence of Polarization-Induced Electric Fields on Optical Properties of Intersubband Transitions in AlxGa1-xN/GaN Double Quantum Wells

Lei Shuangying, Shen Bo, Xu Fujun, Yang Zhijian, Xu Ke, et al.

Chinese Journal of Semiconductors , 2006, 27(3): 403-408.

20

A New Method to Retrieve Proximity Effect Parameters in Electron-Beam Lithography

Kang Xiaohui, Li Zhigang, Liu Ming, Xie Changqing, and Chen Baoqin, et al.

Chinese Journal of Semiconductors , 2005, 26(3): 455-459.

  • Search

    Advanced Search >>

    GET CITATION

    Chen Haiyang, Li Darang, Yin Jianhua, Cai Shengguo. Built-in electric field thickness design for betavoltaic batteries[J]. Journal of Semiconductors, 2011, 32(9): 094009. doi: 10.1088/1674-4926/32/9/094009
    Chen H Y, Li D R, Yin J H, Cai S G. Built-in electric field thickness design for betavoltaic batteries[J]. J. Semicond., 2011, 32(9): 094009. doi: 10.1088/1674-4926/32/9/094009.
    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 3254 Times PDF downloads: 2114 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: 19 April 2011 Online: Published: 01 September 2011

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Chen Haiyang, Li Darang, Yin Jianhua, Cai Shengguo. Built-in electric field thickness design for betavoltaic batteries[J]. Journal of Semiconductors, 2011, 32(9): 094009. doi: 10.1088/1674-4926/32/9/094009 ****Chen H Y, Li D R, Yin J H, Cai S G. Built-in electric field thickness design for betavoltaic batteries[J]. J. Semicond., 2011, 32(9): 094009. doi: 10.1088/1674-4926/32/9/094009.
      Citation:
      Chen Haiyang, Li Darang, Yin Jianhua, Cai Shengguo. Built-in electric field thickness design for betavoltaic batteries[J]. Journal of Semiconductors, 2011, 32(9): 094009. doi: 10.1088/1674-4926/32/9/094009 ****
      Chen H Y, Li D R, Yin J H, Cai S G. Built-in electric field thickness design for betavoltaic batteries[J]. J. Semicond., 2011, 32(9): 094009. doi: 10.1088/1674-4926/32/9/094009.

      Built-in electric field thickness design for betavoltaic batteries

      DOI: 10.1088/1674-4926/32/9/094009
      Funds:

      The National Natural Science Foundation of China (General Program, Key Program, Major Research Plan)

      • Received Date: 2015-08-20
      • Accepted Date: 2011-02-27
      • Revised Date: 2011-04-19
      • Published Date: 2011-08-31

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return