J. Semicond. > 2013, Volume 34 > Issue 3 > 035003
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SEMICONDUCTOR INTEGRATED CIRCUITS

An 8-bit 100-MS/s digital-to-skew converter embedded switch with a 200-ps range for time-interleaved sampling

Xiaoshi Zhu1, Chixiao Chen1, Jialiang Xu1, Fan Ye1, and Junyan Ren1, 2

+ Author Affiliations

 Corresponding author: Ye Fan, Email:fanye@fudan.edu.cn

DOI: 10.1088/1674-4926/34/3/035003

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Abstract: A sampling switch with an embedded digital-to-skew converter (DSC) is presented. The proposed switch eliminates time-interleaved ADCs' skews by adjusting the boosted voltage. A similar bridged capacitors' charge sharing structure is used to minimize the area. The circuit is fabricated in a 0.18 μm CMOS process and achieves sub-1 ps resolution and 200 ps timing range at a rate of 100 MS/s. The power consumption is 430 μW at maximum. The measurement result also includes a 2-channel 14-bit 100 MS/s time-interleaved ADCs (TI-ADCs) with the proposed DSC switch's demonstration. This scheme is widely applicable for the clock skew and aperture error calibration demanded in TI-ADCs and SHA-less ADCs.

Key words: sample-time error, digital-to-skew converter, bootstrapped switch, calibration, time-interleaved



[1]
Straayer M, Perrott M. A multi-path gated ring oscillator TDC with first-order noise shaping. IEEE J Solid-State Circuits, 2009, 44(4):1089 doi: 10.1109/JSSC.2009.2014709
[2]
Yu B, Chen C, Zhu Y, et al. A 14-bit 200-ms/s time-interleaved ADC with sample-time error detection and cancelation. IEEE Asian Solid State Circuits Conference (A-SSCC), 2011:349 http://ieeexplore.ieee.org/document/6123586/
[3]
El-Chammas M, Murmann B. A 12-gs/s 81-mw 5-bit time-interleaved flash ADC with background timing skew calibration. IEEE J Solid-State Circuits, 2011, 46(4):838 doi: 10.1109/JSSC.2011.2108125
[4]
Agnes A, Bonizzoni E, Malcovati P, et al. A 9.4-ENOB 1 V 3.8μW 100 ks/s SAR ADC with time-domain comparator. Digest of Technical Papers, IEEE International Solid-State Circuits Conference, 2008:246 https://www.researchgate.net/publication/4332071_A_94-ENOB_1V_38mW_100kSs_SAR_ADC_with_Time-Domain_Comparator
Fig. 1.  A simple circuit topology of conventional DSC.

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Fig. 2.  Cascading of conventional DSC to expand dynamic range.

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Fig. 3.  (a) Traditional bootstrapped switch. (b) Timing graph of the voltage dependent skew.

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Fig. 4.  Proposed DSC embedded switch.

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Fig. 5.  8-bit charge-redistribution C-2C DAC with a unit scaling capacitor.

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Fig. 6.  8-bit 100-MS/s digital-to-skew converter die photograph.

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Fig. 7.  Post simulation of the proposed circuits on (a) INL and (b) DNL.

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Fig. 8.  Simulated delay line characteristic.

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Fig. 9.  Measured de-skew function by the proposed DSC sampling switch. (a) Before calibration. (b) After calibration.

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[1]
Straayer M, Perrott M. A multi-path gated ring oscillator TDC with first-order noise shaping. IEEE J Solid-State Circuits, 2009, 44(4):1089 doi: 10.1109/JSSC.2009.2014709
[2]
Yu B, Chen C, Zhu Y, et al. A 14-bit 200-ms/s time-interleaved ADC with sample-time error detection and cancelation. IEEE Asian Solid State Circuits Conference (A-SSCC), 2011:349 http://ieeexplore.ieee.org/document/6123586/
[3]
El-Chammas M, Murmann B. A 12-gs/s 81-mw 5-bit time-interleaved flash ADC with background timing skew calibration. IEEE J Solid-State Circuits, 2011, 46(4):838 doi: 10.1109/JSSC.2011.2108125
[4]
Agnes A, Bonizzoni E, Malcovati P, et al. A 9.4-ENOB 1 V 3.8μW 100 ks/s SAR ADC with time-domain comparator. Digest of Technical Papers, IEEE International Solid-State Circuits Conference, 2008:246 https://www.researchgate.net/publication/4332071_A_94-ENOB_1V_38mW_100kSs_SAR_ADC_with_Time-Domain_Comparator

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    Received: 16 May 2012 Revised: 20 October 2012 Online: Published: 01 March 2013

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      Article Navigation >  Journal of Semiconductors  > 2013  >  34(3): 035003
      Xiaoshi Zhu, Chixiao Chen, Jialiang Xu, Fan Ye, Junyan Ren. An 8-bit 100-MS/s digital-to-skew converter embedded switch with a 200-ps range for time-interleaved sampling[J]. Journal of Semiconductors, 2013, 34(3): 035003. doi: 10.1088/1674-4926/34/3/035003 ****X S Zhu, C X Chen, J L Xu, F Ye, J Y Ren. An 8-bit 100-MS/s digital-to-skew converter embedded switch with a 200-ps range for time-interleaved sampling[J]. J. Semicond., 2013, 34(3): 035003. doi: 10.1088/1674-4926/34/3/035003.
      Citation:
      Xiaoshi Zhu, Chixiao Chen, Jialiang Xu, Fan Ye, Junyan Ren. An 8-bit 100-MS/s digital-to-skew converter embedded switch with a 200-ps range for time-interleaved sampling[J]. Journal of Semiconductors, 2013, 34(3): 035003. doi: 10.1088/1674-4926/34/3/035003 ****
      X S Zhu, C X Chen, J L Xu, F Ye, J Y Ren. An 8-bit 100-MS/s digital-to-skew converter embedded switch with a 200-ps range for time-interleaved sampling[J]. J. Semicond., 2013, 34(3): 035003. doi: 10.1088/1674-4926/34/3/035003.
      shu

      An 8-bit 100-MS/s digital-to-skew converter embedded switch with a 200-ps range for time-interleaved sampling

      DOI: 10.1088/1674-4926/34/3/035003
      • 1.

        State Key Laboratory of ASIC & System, Fudan University, Shanghai 201203, China

      • 2.

        Microelectronics Science and Technology Innovation Platform, Fudan University, Shanghai 201203, China

      Funds:

      Project supported by the National Natural Science Foundation of China (No. 61006025) and the Special Research Funds for Doctoral Program of Higher Education of China (No. 20100071110026)

      the Special Research Funds for Doctoral Program of Higher Education of China 20100071110026

      the National Natural Science Foundation of China 61006025

      More Information
      • Corresponding author: Ye Fan, Email:fanye@fudan.edu.cn
      • Received Date: 2012-05-16
      • Revised Date: 2012-10-20
      • Published Date: 2013-03-01

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