Citation: |
Jie Wang, Lingling Sun, Jun Liu, Mingzhu Zhou. A surface-potential-based model for AlGaN/AlN/GaN HEMT[J]. Journal of Semiconductors, 2013, 34(9): 094002. doi: 10.1088/1674-4926/34/9/094002
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J Wang, L L Sun, J Liu, M Z Zhou. A surface-potential-based model for AlGaN/AlN/GaN HEMT[J]. J. Semicond., 2013, 34(9): 094002. doi: 10.1088/1674-4926/34/9/094002.
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A surface-potential-based model for AlGaN/AlN/GaN HEMT
DOI: 10.1088/1674-4926/34/9/094002
More Information
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Abstract
A new surface-potential-based model for AlGaN/AlN/GaN high electron mobility transistor (HEMT) is proposed in this paper. Since the high polarization effects caused by AlN interlayer favorably influence the two dimensional electron gas (2DEG) and scattering mechanisms, we first add spontaneous and piezoelectric charge terms to the source equation of surface-potential, and a mobility model for AlGaN/AlN/GaN HEMT is rewritten. Compared with TCAD simulations, the DC characteristics of AlGaN/AlN/GaN HEMT are faithfully reproduced by the new model.-
Keywords:
- AlGaN/AlN/GaN HEMT,
- 2DEG,
- surface potential,
- polarization effects,
- mobility
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References
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