Fig. 1.
Structure of SLD. (a) Interconnected structure. (b) Butterfly typed packaging.
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| Citation: |
Ningning Sun, Manqing Tan, Ping Li, Jian Jiao, Xiaofeng Guo, Wentao Guo. Long-term storage life of light source modules by temperature cycling accelerated life test[J]. Journal of Semiconductors, 2014, 35(5): 054010. doi: 10.1088/1674-4926/35/5/054010
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N N Sun, M Q Tan, P Li, J Jiao, X F Guo, W T Guo. Long-term storage life of light source modules by temperature cycling accelerated life test[J]. J. Semicond., 2014, 35(5): 054010. doi: 10.1088/1674-4926/35/5/054010.
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Long-term storage life of light source modules by temperature cycling accelerated life test
DOI: 10.1088/1674-4926/35/5/054010
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Abstract
Light source modules are the most crucial and fragile devices that affect the life and reliability of the interferometric fiber optic gyroscope (IFOG). While the light emitting chips were stable in most cases, the module packaging proved to be less satisfactory. In long-term storage or the working environment, the ambient temperature changes constantly and thus the packaging and coupling performance of light source modules are more likely to degrade slowly due to different materials with different coefficients of thermal expansion in the bonding interface. A constant temperature accelerated life test cannot evaluate the impact of temperature variation on the performance of a module package, so the temperature cycling accelerated life test was studied. The main failure mechanism affecting light source modules is package failure due to solder fatigue failure including a fiber coupling shift, loss of cooling efficiency and thermal resistor degradation, so the Norris-Landzberg model was used to model solder fatigue life and determine the activation energy related to solder fatigue failure mechanism. By analyzing the test data, activation energy was determined and then the mean life of light source modules in different storage environments with a continuously changing temperature was simulated, which has provided direct reference data for the storage life prediction of IFOG. -
References
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