J. Semicond. > 2015, Volume 36 > Issue 1 > 013002
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SEMICONDUCTOR MATERIALS

Structural, optical and electrical properties of zinc oxide thin films deposited by a spray pyrolysis technique

Yacine Aoun1, Boubaker Benhaoua2, Brahim Gasmi3 and Said Benramache3, 4

+ Author Affiliations

 Corresponding author: Yacine Aoun, E-mail: aounyacine07@gmail.com; Said Benramache, E-mail: saidzno2006@gmail.com

DOI: 10.1088/1674-4926/36/1/013002

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Abstract: Zinc oxide (ZnO) thin films were deposited on glass substrates by spray pyrolysis technique decomposition of zinc acetate dihydrate in an ethanol solution with 30 mL of deposition rate, the ZnO thin films were deposited at two different temperatures: 300 and 350 ℃. The substrates were heated using the solar cells method. The substrate was R217102 glass, whose size was 30 × 17.5 × 1 mm3. The films exhibit a hexagonal wurtzite structure with a strong (002) preferred orientation. The higher value of crystallite size is attained for sprayed films at 350 ℃, which is probably due to an improvement of the crystallinity of the films at this point. The average trans mittance of obtain films is about 90%-95%, as measured by a UV-vis analyzer. The band gap energy varies from 3.265 to 3.294 eV for the deposited ZnO thin film at 300 and 350 ℃, respectively. The electrical resistivity measured of our films are in the order 0.36 Ω·cm.

Key words: ZnO, thin films, substrate temperature, spray pyrolysis technique



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Fig. 1.  A photograph of the experimental setup.

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Fig. 2.  X-ray diffraction spectra of ZnO thin films sprayed at 300 and 350 C.

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Fig. 3.  Transmission spectra $T(\lambda)$ of ZnO thin films sprayed at 300 and 350 C.

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Fig. 4.  The typical variation of $(Ah\nu)^2$ versus photon energy of deposited ZnO thin film at 300 and 350 C.

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Fig. 5.  The typical variation of LA versus photon energy of deposited ZnO thin film at 300 and 350 C.

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Table 1.   Recapitulating measured values of Bragg angle (2$\theta )$, the inter planar spacing ($d)$, the full width at half-maximum (FWHM), the crystallite size ($G)$ and lattice parameters (cand $a)$ for ZnO thin films deposited at 300 and 350 C.

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Table 2.   Recapitulating measured values of band gap energy ($E_{\rm g})$, Urbach energy ($E_{\rm u})$, and electrical resistivity ($\rho$) for ZnO thin films deposited at 300 and 350 C.

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    Received: 03 April 2014 Revised: Online: Published: 01 January 2015

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      Article Navigation >  Journal of Semiconductors  > 2015  >  36(1): 013002
      Yacine Aoun, Boubaker Benhaoua, Brahim Gasmi, Said Benramache. Structural, optical and electrical properties of zinc oxide thin films deposited by a spray pyrolysis technique[J]. Journal of Semiconductors, 2015, 36(1): 013002. doi: 10.1088/1674-4926/36/1/013002 ****Y Aoun, B Benhaoua, B Gasmi, S Benramache. Structural, optical and electrical properties of zinc oxide thin films deposited by a spray pyrolysis technique[J]. J. Semicond., 2015, 36(1): 013002. doi:  10.1088/1674-4926/36/1/013002.
      Citation:
      Yacine Aoun, Boubaker Benhaoua, Brahim Gasmi, Said Benramache. Structural, optical and electrical properties of zinc oxide thin films deposited by a spray pyrolysis technique[J]. Journal of Semiconductors, 2015, 36(1): 013002. doi: 10.1088/1674-4926/36/1/013002 ****
      Y Aoun, B Benhaoua, B Gasmi, S Benramache. Structural, optical and electrical properties of zinc oxide thin films deposited by a spray pyrolysis technique[J]. J. Semicond., 2015, 36(1): 013002. doi:  10.1088/1674-4926/36/1/013002.
      shu

      Structural, optical and electrical properties of zinc oxide thin films deposited by a spray pyrolysis technique

      DOI: 10.1088/1674-4926/36/1/013002
      • 1.

        Mechanical Department, Faculty of Technology, University of Biskra, Biskra 07000, Algeria

      • 2.

        VTRS Laboratory, Institute of Technology, University of El-Oued, El-Oued 39000, Algeria

      • 3.

        Laboratoire de Physique des Couches Minces et Application, University of Biskra, Biskra 07000, Algeria

      • 4.

        Material Sciences Department, Faculty of Science, University of Biskra, Biskra 07000, Algeria

      More Information
      • Corresponding author: E-mail: aounyacine07@gmail.com; E-mail: saidzno2006@gmail.com
      • Received Date: 2014-04-03
      • Accepted Date: 2014-08-19
      • Published Date: 2015-01-25

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