J. Semicond. > 2016, Volume 37 > Issue 7 > 074010

SEMICONDUCTOR DEVICES

The establishment of reliability model for LED lamps

Jian Hao1, 2, Lei Jing1, Yao Wang1, 2, Qun Gao1, Hongliang Ke1, 2, Xiaoxun Wang1, 2, Yanchao Zhang1, Qiang Sun1, and Zhijun Xu1

+ Author Affiliations

 Corresponding author: Sun Qiang, Email: sunq@ciomp.ac.cn

DOI: 10.1088/1674-4926/37/7/074010

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Abstract: In order to verify which of the distributions and established methods of reliability model are more suitable for the analysis of the accelerated aging of LED lamp, three established methods (approximate method, analytical method and two-stage method) of reliability model are used to analyze the experimental data under the condition of the Weibull distribution and Lognormal distribution, in this paper. Ten LED lamps are selected for the accelerated aging experiment and the luminous fluxes are measured at an accelerated aging temperature. AIC information criterion is adopted in the evaluation of the models. The results show that the accuracies of the analytical method and the two-stage method are higher than that of the approximation method, with the widths of confidence intervals of unknown parameters of the reliability model being the smallest for the two-stage method. In a comparison between the two types of distributions, the accuracies are nearly identical.

Key words: acceleratorLED lampsapproximate methodanalytical methodtwo-stage methodAIC



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.  (Color online) The change of Lumen maintenance.

.  (Color online) The variation of the failure probability for two distribution.

.  (Color online) The change of spectral.

.  Color online) The change of CCT.

.   Accelerated lifetimes

.   Parameter values of different methods.

[1]
[2]
[3]
[4]
[5]
[6]
[7]
Yi Dong. Research on rapid detection technology for the life of light-emitting-diode lamps. Master Dissertation, China Jiliang University, 2012
[8]
[9]
[10]
[11]
[12]
Illuminating Engineering Society, LM-79-08 Electrical and Photometric Measurements of Solid State Lighting Products, 2008
[13]
Akaike H. A new look at the statistical model identification. IEEE Trans Autom Control, 1974, AC-19(6):716
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    Received: 10 September 2015 Revised: Online: Published: 01 July 2016

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      Jian Hao, Lei Jing, Yao Wang, Qun Gao, Hongliang Ke, Xiaoxun Wang, Yanchao Zhang, Qiang Sun, Zhijun Xu. The establishment of reliability model for LED lamps[J]. Journal of Semiconductors, 2016, 37(7): 074010. doi: 10.1088/1674-4926/37/7/074010 ****J Hao, L Jing, Y Wang, Q Gao, H L Ke, X X Wang, Y C Zhang, Q Sun, Z J Xu. The establishment of reliability model for LED lamps[J]. J. Semicond., 2016, 37(7): 074010. doi: 10.1088/1674-4926/37/7/074010.
      Citation:
      Jian Hao, Lei Jing, Yao Wang, Qun Gao, Hongliang Ke, Xiaoxun Wang, Yanchao Zhang, Qiang Sun, Zhijun Xu. The establishment of reliability model for LED lamps[J]. Journal of Semiconductors, 2016, 37(7): 074010. doi: 10.1088/1674-4926/37/7/074010 ****
      J Hao, L Jing, Y Wang, Q Gao, H L Ke, X X Wang, Y C Zhang, Q Sun, Z J Xu. The establishment of reliability model for LED lamps[J]. J. Semicond., 2016, 37(7): 074010. doi: 10.1088/1674-4926/37/7/074010.

      The establishment of reliability model for LED lamps

      DOI: 10.1088/1674-4926/37/7/074010
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      • Corresponding author: Sun Qiang, Email: sunq@ciomp.ac.cn
      • Received Date: 2015-09-10
      • Accepted Date: 2015-10-27
      • Published Date: 2016-07-25

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