Citation: |
Xiaoqing Huo, Huaqing Si, Kun Zhao, Yingwu Zhang, Hongjuan Cheng, Yongkuan Xu. High infrared transmittance CdS single crystal grown by physical vapor transport[J]. Journal of Semiconductors, 2018, 39(12): 123003. doi: 10.1088/1674-4926/39/12/123003
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X Q Huo, H Q Si, K Zhao, Y W Zhang, H J Cheng, Y K Xu, High infrared transmittance CdS single crystal grown by physical vapor transport[J]. J. Semicond., 2018, 39(12): 123003. doi: 10.1088/1674-4926/39/12/123003.
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High infrared transmittance CdS single crystal grown by physical vapor transport
DOI: 10.1088/1674-4926/39/12/123003
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Abstract
Φ55 × 15 mm2 CdS bulk single crystal with high infrared transmittance was grown by physical vapor transport. The single crystal has a consistent structure from top to bottom, which was confirmed by X-ray diffraction. The (002) full-width at half-maximum of the X-ray diffraction was measured to be 60.00 arcsec, indicating a good quality of the structure. Hall mobility, specific resistivity, and carrier concentration for the top and bottom of the crystal were observed as well. Transmittance for the CdS single crystal was measured to be higher than 70% from 2.5 to 4.5 µm, making the single crystal an important candidate for infrared window materials. Furthermore, the absorption mechanism of the CdS single crystal was analyzed. -
References
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