High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling

Mengke Wang; Shangjian Zhang; Zhao Liu; Xuyan Zhang; Yutong He; Yangxue Ma; Yali Zhang; Zhiyao Zhang; Yong Liu

doi:10.1088/1674-4926/42/4/042303

J. Semicond. > 2021, Volume 42 > Issue 4 > 042303

ARTICLES

High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling

Mengke Wang, Shangjian Zhang, Zhao Liu, Xuyan Zhang, Yutong He, Yangxue Ma, Yali Zhang, Zhiyao Zhang and Yong Liu

+ Author Affiliations

State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China

Author Bio:

received her B.S. and M.Sc. degrees from the University of Electronic Science and Technology of China, Chengdu, China, in 2014 and in 2017, respectively, where she is currently pursuing the Ph.D. degree at the School of Optoelectronic Science and Engineering. Her research interests include high-speed optoelectronic devices.

received his Ph.D. degree from the Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China, in 2006.During 2008 to 2009, he was a visiting scholar with the Eindhoven University of Technology, Eindhoven, The Netherlands. From 2015 to 2017, he was on sabbatical with the University of California, Santa Barbara, CA, USA. Since 2013, he has been a Full Professor with the School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China. He has authored or co-authored more than 140 papers and holds 19 patents. His research interests include high-speed optoelectronic devices, integrated optics, and microwave photonics.

received her Ph.D. degree from the Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China, in 2008. From 2011 to 2012, she was a visiting scholar with the University of Melbourne, Melbourne, VIC, Australia. She is currently an Associate Professor with the School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China. Her research interests include optical communications, integrated optics, and microwave photonics.

received his Ph.D. degree from the University of Electronic Science and Technology of China, Chengdu, China, in 2010. In 2010, he joined the University of Electronic Science and Technology of China as a Lecturer, where he became an Associate Professor in 2014. In 2017, he was a visiting scholar in the Microwave Photonics Research Laboratory, School of Electrical Engineering and Computer Science, University of Ottawa, ON, Canada. His research interests include microwave photonics and nonlinear fiber optics.

was born in Sichuan, China, in 1970. He received the M.Sc. degree from the University of Electronic Science and Technology of China, Chengdu, China, in 1994, and the Ph.D. degree from Eindhoven University of Technology, Eindhoven, The Netherlands, in 2004. From 1994 to 2000, he was with the University of Electronic Science and Technology of China. In 2000, he was with the COBRA Research Institute, Eindhoven University of Technology. Since 2007, he has been a Full Professor with the University of Electronic Science and Technology of China, Chengdu, China. His research interests include optical nonlinearities and applications, optical signal processing, and optical fiber technologies. Dr. Liu has co-authored more than 200 journal and conference papers. He was the recipient of the IEEE Lasers and Electro-Optics Society Graduate Student Fellowship in 2003, the Chinese National Science Fund for Distinguished Young Scholars in 2009, and the Chinese Chang Jiang Scholar in 2013.

Corresponding author: Shangjian Zhang, sjzhang@uestc.edu.cn

DOI: 10.1088/1674-4926/42/4/042303

Abstract: We propose a low-speed photonic sampling for independent high-frequency characterization of a Mach–Zehnder modulator (MZM) and a photodetector (PD) in an optical link. A low-speed mode-locked laser diode (MLLD) provides an ultra-wideband optical stimulus with scalable frequency range, working as the photonic sampling source of the link. The uneven spectrum lines of the MLLD are firstly characterized with symmetric modulation within the interesting frequency range. Then, the electro-optic modulated signals are down-converted to the first Nyquist frequency range, yielding the self-referenced extraction of modulation depth and half-wave voltage of the MZM without correcting the responsivity fluctuation of the PD in the link. Finally, the frequency responsivity of the PD is self-referenced measured under null modulation of the MZM. As frequency responses of the MZM and the PD can be independently obtained, our method allows self-referenced high-frequency measurement for a high-speed optical link. In the proof-of-concept experiment, a 96.9 MS/s MLLD is used for measuring a MZM and a PD within the frequency range up to 50 GHz. The consistency between our method and the conventional method verifies that the ultra-wideband and self-referenced high-frequency characterization of high-speed MZMs and PDs.

Key words: frequency response, modulators, photodetectors, low-speed photonic sampling, microwave photonics

References

[1]	Capmany J, Mora J, Gasulla I, et al. Microwave photonic signal processing. J Lightwave Technol, 2013, 31(4), 571 doi: 10.1109/JLT.2012.2222348
[2]	Marpaung D, Yao J P, Capmany J. Integrated microwave photonics. Nat Photon, 2019, 13(1), 80 doi: 10.1002/lpor.201200032
[3]	Yi X K, Chew S X, Song S J, et al. Integrated microwave photonics for wideband signal processing. Photonics, 2017, 4(4), 46 doi: 10.3390/photonics4040046
[4]	Wang C, Zhang M, Chen X, et al. Integrated lithium niobate electro-optic modulators operating at CMOS-compatible voltages. Nature, 2018, 562(7725), 101 doi: 10.1038/s41586-018-0551-y
[5]	Sun K, Beling A. High-speed photodetector for microwave photonics. Appl Sci, 2019, 9(4), 623 doi: 10.3390/app9040623
[6]	Shi Y Q, Yan L S, Willner A E. High-speed electrooptic modulator characterization using optical spectrum analysis. J Lightwave Technol, 2003, 21(10), 2358 doi: 10.1109/JLT.2003.818162
[7]	Liao Y, Zhou H J, Meng Z. Modulation efficiency of a LiNbO₃ waveguide electro-optic intensity modulator operating at high microwave frequency. Opt Lett, 2009, 34(12), 1822 doi: 10.1364/OL.34.001822
[8]	Ye Q Y, Yang C, Chong Y H. Improved frequency response measurement method of half-wave voltage for phase modulator. Optik, 2014, 125(2), 745 doi: 10.1016/j.ijleo.2013.07.042
[9]	Rideout W, Eichen E, Schlafer J, et al. Relative intensity noise in semiconductor optical amplifiers. IEEE Photon Technol Lett, 1989, 1(12), 438 doi: 10.1109/68.46042
[10]	Eichen E, Schlafer J, Rideout W, et al. Wide-bandwidth receiver photodetector frequency response measurements using amplified spontaneous emission from a semiconductor optical amplifier. J Lightwave Technol, 1990, 8(6), 912 doi: 10.1109/50.54509
[11]	Xie F Z, Kuhl D, Böttcher E H, et al. Wide-band frequency response measurements of photodetectors using low-level photocurrent noise detection. J Appl Phys, 1993, 73(12), 8641 doi: 10.1063/1.353397
[12]	Baney D M, Sorin W V, Newton S A. High-frequency photodiode characterization using a filtered intensity noise technique. IEEE Photon Technol Lett, 1994, 6(10), 1258 doi: 10.1109/68.329656
[13]	Shao Y, Gallawa R L. Fiber bandwidth measurement using pulse spectrum analysis. Appl Opt, 1986, 25(7), 1069 doi: 10.1364/AO.25.001069
[14]	Hawkins R T, Jones M D, Pepper S H, et al. Comparison of fast photodetector response measurements by optical heterodyne and pulse response techniques. J Lightwave Technol, 1991, 9(10), 1289 doi: 10.1109/50.90926
[15]	Wang L X, Zhu N H, Ke J H, et al. Improved peak power method for measuring frequency responses of photodetectors in a self-heterodyne system. Microw Opt Technol Lett, 2010, 52(10), 2199 doi: 10.1002/mop.25448
[16]	Miao A, Huang Y Q, Huang H, et al. Wideband calibration of photodetector frequency response based on optical heterodyne measurement. Microw Opt Technol Lett, 2009, 51(1), 44 doi: 10.1002/mop.23957
[17]	Koch C. Measuring the photodetector frequency response for ultrasonic applications by a heterodyne system with difference-frequency servo control. IEEE T Ultrason Ferr, 2010, 57(5), 1169 doi: 10.1109/TUFFC.2010/1529
[18]	Dennis T, Hale P D. High-accuracy photoreceiver frequency response measurements at 1.55 µm by use of a heterodyne phase-locked loop. Opt Express, 2011, 19(21), 20103 doi: 10.1364/OE.19.020103
[19]	Feng X J, Yang P, He L B, et al. Heterodyne system for measuring frequency response of photodetectors in ultrasonic applications. IEEE Photon Technol Lett, 2016, 28(12), 1360 doi: 10.1109/LPT.2016.2542839
[20]	Hale P D, Williams D F. Calibrated measurement of optoelectronic frequency response. IEEE Trans Microw Theory Tech, 2003, 51(4), 1422 doi: 10.1109/TMTT.2003.809186
[21]	Wu X M, Man J W, Xie L, et al. Novel method for frequency response measurement of optoelectronic devices. IEEE Photon Technol Lett, 2012, 24(7), 575 doi: 10.1109/LPT.2012.2183122
[22]	Ye Q Y, Yang C, Chong Y H. Measuring the frequency response of photodiode using phase-modulated interferometric detection. IEEE Photon Technol Lett, 2013, 26(1), 29 doi: 10.1109/LPT.2013.2280767
[23]	Wu X M, Man J W, Xie L, et al. A new method for measuring the frequency response of broadband optoelectronic devices. IEEE Photon J, 2012, 4(5), 1679 doi: 10.1109/JPHOT.2012.2213297
[24]	Zhang S J, Zhang C, Wang H, et al. Self-calibrated microwave characterization of high-speed optoelectronic devices by heterodyne spectrum mapping. J Lightwave Technol, 2017, 35(10), 1952 doi: 10.1109/JLT.2017.2678978
[25]	Zhang S J, Zhang C, Wang H, et al. On-wafer probing-kit for RF characterization of silicon photonic integrated transceivers. Opt Express, 2017, 25(12), 13340 doi: 10.1364/OE.25.013340
[26]	Zhang S J, Wang H, Zou X H, et al. Electrical probing test for characterizing wideband optical transceiving devices with self-reference and on-chip capability. J Lightwave Technol, 2018, 36(19), 4326 doi: 10.1109/JLT.2018.2822944
[27]	Zhang S J, Li W, Chen W, et al. Accurate calibration and measurement of optoelectronic devices. J Lightwave Technol, 2020 doi: 10.1109/JLT.2020.3010065
[28]	Ma Y X, Zhang Z Y, Zhang S J, et al. Self-calibrating microwave characterization of broadband Mach–Zehnder electro-optic modulator employing low-speed photonic down-conversion sampling and low-frequency detection. J Lightwave Technol, 2018, 37(11), 2668 doi: 10.1109/JLT.2018.2874965
[29]	Zhang S J, Zhang C, Wang H, et al. Calibration-free measurement of high-speed Mach-Zehnder modulator based on low-frequency detection. Opt Lett, 2016, 41(3), 460 doi: 10.1364/OL.41.000460

Fig. 1. (Color online) Schematic diagram of the proposed method based on low-speed photonic sampling. MLLD: passively mode-locked laser diode, PC: polarization controller. MZM: electro-optic Mach-Zehnder modulator. DUT: device under test. MS: microwave source. PD: photodetector. ESA: electrical spectrum analyzer.

DownLoad: Full-Size Img PowerPoint

Fig. 2. (Color online) Measured electrical spectra of photonic sampling signals at different symmetric modulation frequencies for extracting the uneven response of the MLLD.

DownLoad: Full-Size Img PowerPoint

Fig. 3. (Color online) Measured uneven response p_n/p₁ induced by the comb lines from the MLLD.

DownLoad: Full-Size Img PowerPoint

Fig. 4. (Color online) Measured typical electrical spectra of the MZM under test at different modulation frequencies.

DownLoad: Full-Size Img PowerPoint

Fig. 5. Measured modulation depth and microwave driving power applied on the MZM.

DownLoad: Full-Size Img PowerPoint

Fig. 6. (Color online) Measured half-wave voltage and relative frequency response of the MZM under test with our method (red open circles) and the electro-optic heterodyne mixing method (blue solid circles).

DownLoad: Full-Size Img PowerPoint

Fig. 8. (Color online) Measured frequency response of PD under test with our method (red line) and the electro-optic heterodyne mixing method (open circles).

DownLoad: Full-Size Img PowerPoint

Fig. 7. Measured electrical spectra of the repetition frequencies nf_r when the MZM works with null modulation, in the case of the PD under test.

DownLoad: Full-Size Img PowerPoint

Fig. 9. Error transfer factor as a function of modulation depth.

DownLoad: Full-Size Img PowerPoint

[1]	Capmany J, Mora J, Gasulla I, et al. Microwave photonic signal processing. J Lightwave Technol, 2013, 31(4), 571 doi: 10.1109/JLT.2012.2222348
[2]	Marpaung D, Yao J P, Capmany J. Integrated microwave photonics. Nat Photon, 2019, 13(1), 80 doi: 10.1002/lpor.201200032
[3]	Yi X K, Chew S X, Song S J, et al. Integrated microwave photonics for wideband signal processing. Photonics, 2017, 4(4), 46 doi: 10.3390/photonics4040046
[4]	Wang C, Zhang M, Chen X, et al. Integrated lithium niobate electro-optic modulators operating at CMOS-compatible voltages. Nature, 2018, 562(7725), 101 doi: 10.1038/s41586-018-0551-y
[5]	Sun K, Beling A. High-speed photodetector for microwave photonics. Appl Sci, 2019, 9(4), 623 doi: 10.3390/app9040623
[6]	Shi Y Q, Yan L S, Willner A E. High-speed electrooptic modulator characterization using optical spectrum analysis. J Lightwave Technol, 2003, 21(10), 2358 doi: 10.1109/JLT.2003.818162
[7]	Liao Y, Zhou H J, Meng Z. Modulation efficiency of a LiNbO₃ waveguide electro-optic intensity modulator operating at high microwave frequency. Opt Lett, 2009, 34(12), 1822 doi: 10.1364/OL.34.001822
[8]	Ye Q Y, Yang C, Chong Y H. Improved frequency response measurement method of half-wave voltage for phase modulator. Optik, 2014, 125(2), 745 doi: 10.1016/j.ijleo.2013.07.042
[9]	Rideout W, Eichen E, Schlafer J, et al. Relative intensity noise in semiconductor optical amplifiers. IEEE Photon Technol Lett, 1989, 1(12), 438 doi: 10.1109/68.46042
[10]	Eichen E, Schlafer J, Rideout W, et al. Wide-bandwidth receiver photodetector frequency response measurements using amplified spontaneous emission from a semiconductor optical amplifier. J Lightwave Technol, 1990, 8(6), 912 doi: 10.1109/50.54509
[11]	Xie F Z, Kuhl D, Böttcher E H, et al. Wide-band frequency response measurements of photodetectors using low-level photocurrent noise detection. J Appl Phys, 1993, 73(12), 8641 doi: 10.1063/1.353397
[12]	Baney D M, Sorin W V, Newton S A. High-frequency photodiode characterization using a filtered intensity noise technique. IEEE Photon Technol Lett, 1994, 6(10), 1258 doi: 10.1109/68.329656
[13]	Shao Y, Gallawa R L. Fiber bandwidth measurement using pulse spectrum analysis. Appl Opt, 1986, 25(7), 1069 doi: 10.1364/AO.25.001069
[14]	Hawkins R T, Jones M D, Pepper S H, et al. Comparison of fast photodetector response measurements by optical heterodyne and pulse response techniques. J Lightwave Technol, 1991, 9(10), 1289 doi: 10.1109/50.90926
[15]	Wang L X, Zhu N H, Ke J H, et al. Improved peak power method for measuring frequency responses of photodetectors in a self-heterodyne system. Microw Opt Technol Lett, 2010, 52(10), 2199 doi: 10.1002/mop.25448
[16]	Miao A, Huang Y Q, Huang H, et al. Wideband calibration of photodetector frequency response based on optical heterodyne measurement. Microw Opt Technol Lett, 2009, 51(1), 44 doi: 10.1002/mop.23957
[17]	Koch C. Measuring the photodetector frequency response for ultrasonic applications by a heterodyne system with difference-frequency servo control. IEEE T Ultrason Ferr, 2010, 57(5), 1169 doi: 10.1109/TUFFC.2010/1529
[18]	Dennis T, Hale P D. High-accuracy photoreceiver frequency response measurements at 1.55 µm by use of a heterodyne phase-locked loop. Opt Express, 2011, 19(21), 20103 doi: 10.1364/OE.19.020103
[19]	Feng X J, Yang P, He L B, et al. Heterodyne system for measuring frequency response of photodetectors in ultrasonic applications. IEEE Photon Technol Lett, 2016, 28(12), 1360 doi: 10.1109/LPT.2016.2542839
[20]	Hale P D, Williams D F. Calibrated measurement of optoelectronic frequency response. IEEE Trans Microw Theory Tech, 2003, 51(4), 1422 doi: 10.1109/TMTT.2003.809186
[21]	Wu X M, Man J W, Xie L, et al. Novel method for frequency response measurement of optoelectronic devices. IEEE Photon Technol Lett, 2012, 24(7), 575 doi: 10.1109/LPT.2012.2183122
[22]	Ye Q Y, Yang C, Chong Y H. Measuring the frequency response of photodiode using phase-modulated interferometric detection. IEEE Photon Technol Lett, 2013, 26(1), 29 doi: 10.1109/LPT.2013.2280767
[23]	Wu X M, Man J W, Xie L, et al. A new method for measuring the frequency response of broadband optoelectronic devices. IEEE Photon J, 2012, 4(5), 1679 doi: 10.1109/JPHOT.2012.2213297
[24]	Zhang S J, Zhang C, Wang H, et al. Self-calibrated microwave characterization of high-speed optoelectronic devices by heterodyne spectrum mapping. J Lightwave Technol, 2017, 35(10), 1952 doi: 10.1109/JLT.2017.2678978
[25]	Zhang S J, Zhang C, Wang H, et al. On-wafer probing-kit for RF characterization of silicon photonic integrated transceivers. Opt Express, 2017, 25(12), 13340 doi: 10.1364/OE.25.013340
[26]	Zhang S J, Wang H, Zou X H, et al. Electrical probing test for characterizing wideband optical transceiving devices with self-reference and on-chip capability. J Lightwave Technol, 2018, 36(19), 4326 doi: 10.1109/JLT.2018.2822944
[27]	Zhang S J, Li W, Chen W, et al. Accurate calibration and measurement of optoelectronic devices. J Lightwave Technol, 2020 doi: 10.1109/JLT.2020.3010065
[28]	Ma Y X, Zhang Z Y, Zhang S J, et al. Self-calibrating microwave characterization of broadband Mach–Zehnder electro-optic modulator employing low-speed photonic down-conversion sampling and low-frequency detection. J Lightwave Technol, 2018, 37(11), 2668 doi: 10.1109/JLT.2018.2874965
[29]	Zhang S J, Zhang C, Wang H, et al. Calibration-free measurement of high-speed Mach-Zehnder modulator based on low-frequency detection. Opt Lett, 2016, 41(3), 460 doi: 10.1364/OL.41.000460

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Received: 30 October 2020 Revised: 03 December 2020 Online: Accepted Manuscript: 27 January 2021Uncorrected proof: 30 January 2021Published: 12 April 2021

Article Navigation > Journal of Semiconductors > 2021 > 42(4): 042303

Mengke Wang, Shangjian Zhang, Zhao Liu, Xuyan Zhang, Yutong He, Yangxue Ma, Yali Zhang, Zhiyao Zhang, Yong Liu. High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling[J]. Journal of Semiconductors, 2021, 42(4): 042303. doi: 10.1088/1674-4926/42/4/042303 ****M K Wang, S J Zhang, Z Liu, X Y Zhang, Y T He, Y X Ma, Y L Zhang, Z Y Zhang, Y Liu, High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling[J]. J. Semicond., 2021, 42(4): 042303. doi: 10.1088/1674-4926/42/4/042303.

Citation:

M K Wang, S J Zhang, Z Liu, X Y Zhang, Y T He, Y X Ma, Y L Zhang, Z Y Zhang, Y Liu, High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling[J]. J. Semicond., 2021, 42(4): 042303. doi: 10.1088/1674-4926/42/4/042303.

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High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling

DOI: 10.1088/1674-4926/42/4/042303

State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China

More Information

Mengke Wang：received her B.S. and M.Sc. degrees from the University of Electronic Science and Technology of China, Chengdu, China, in 2014 and in 2017, respectively, where she is currently pursuing the Ph.D. degree at the School of Optoelectronic Science and Engineering. Her research interests include high-speed optoelectronic devices
Shangjian Zhang：received his Ph.D. degree from the Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China, in 2006.During 2008 to 2009, he was a visiting scholar with the Eindhoven University of Technology, Eindhoven, The Netherlands. From 2015 to 2017, he was on sabbatical with the University of California, Santa Barbara, CA, USA. Since 2013, he has been a Full Professor with the School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China. He has authored or co-authored more than 140 papers and holds 19 patents. His research interests include high-speed optoelectronic devices, integrated optics, and microwave photonics
Yali Zhang：received her Ph.D. degree from the Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China, in 2008. From 2011 to 2012, she was a visiting scholar with the University of Melbourne, Melbourne, VIC, Australia. She is currently an Associate Professor with the School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China. Her research interests include optical communications, integrated optics, and microwave photonics
Zhiyao Zhang：received his Ph.D. degree from the University of Electronic Science and Technology of China, Chengdu, China, in 2010. In 2010, he joined the University of Electronic Science and Technology of China as a Lecturer, where he became an Associate Professor in 2014. In 2017, he was a visiting scholar in the Microwave Photonics Research Laboratory, School of Electrical Engineering and Computer Science, University of Ottawa, ON, Canada. His research interests include microwave photonics and nonlinear fiber optics
Yong Liu：was born in Sichuan, China, in 1970. He received the M.Sc. degree from the University of Electronic Science and Technology of China, Chengdu, China, in 1994, and the Ph.D. degree from Eindhoven University of Technology, Eindhoven, The Netherlands, in 2004. From 1994 to 2000, he was with the University of Electronic Science and Technology of China. In 2000, he was with the COBRA Research Institute, Eindhoven University of Technology. Since 2007, he has been a Full Professor with the University of Electronic Science and Technology of China, Chengdu, China. His research interests include optical nonlinearities and applications, optical signal processing, and optical fiber technologies. Dr. Liu has co-authored more than 200 journal and conference papers. He was the recipient of the IEEE Lasers and Electro-Optics Society Graduate Student Fellowship in 2003, the Chinese National Science Fund for Distinguished Young Scholars in 2009, and the Chinese Chang Jiang Scholar in 2013
Corresponding author: sjzhang@uestc.edu.cn
Received Date: 2020-10-30
Revised Date: 2020-12-03
Published Date: 2021-04-10

Abstract

Abstract

We propose a low-speed photonic sampling for independent high-frequency characterization of a Mach–Zehnder modulator (MZM) and a photodetector (PD) in an optical link. A low-speed mode-locked laser diode (MLLD) provides an ultra-wideband optical stimulus with scalable frequency range, working as the photonic sampling source of the link. The uneven spectrum lines of the MLLD are firstly characterized with symmetric modulation within the interesting frequency range. Then, the electro-optic modulated signals are down-converted to the first Nyquist frequency range, yielding the self-referenced extraction of modulation depth and half-wave voltage of the MZM without correcting the responsivity fluctuation of the PD in the link. Finally, the frequency responsivity of the PD is self-referenced measured under null modulation of the MZM. As frequency responses of the MZM and the PD can be independently obtained, our method allows self-referenced high-frequency measurement for a high-speed optical link. In the proof-of-concept experiment, a 96.9 MS/s MLLD is used for measuring a MZM and a PD within the frequency range up to 50 GHz. The consistency between our method and the conventional method verifies that the ultra-wideband and self-referenced high-frequency characterization of high-speed MZMs and PDs.
- frequency response,
- modulators,
- photodetectors,
- low-speed photonic sampling,
- microwave photonics

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References(29)

References

[1]	Capmany J, Mora J, Gasulla I, et al. Microwave photonic signal processing. J Lightwave Technol, 2013, 31(4), 571 doi: 10.1109/JLT.2012.2222348
[2]	Marpaung D, Yao J P, Capmany J. Integrated microwave photonics. Nat Photon, 2019, 13(1), 80 doi: 10.1002/lpor.201200032
[3]	Yi X K, Chew S X, Song S J, et al. Integrated microwave photonics for wideband signal processing. Photonics, 2017, 4(4), 46 doi: 10.3390/photonics4040046
[4]	Wang C, Zhang M, Chen X, et al. Integrated lithium niobate electro-optic modulators operating at CMOS-compatible voltages. Nature, 2018, 562(7725), 101 doi: 10.1038/s41586-018-0551-y
[5]	Sun K, Beling A. High-speed photodetector for microwave photonics. Appl Sci, 2019, 9(4), 623 doi: 10.3390/app9040623
[6]	Shi Y Q, Yan L S, Willner A E. High-speed electrooptic modulator characterization using optical spectrum analysis. J Lightwave Technol, 2003, 21(10), 2358 doi: 10.1109/JLT.2003.818162
[7]	Liao Y, Zhou H J, Meng Z. Modulation efficiency of a LiNbO₃ waveguide electro-optic intensity modulator operating at high microwave frequency. Opt Lett, 2009, 34(12), 1822 doi: 10.1364/OL.34.001822
[8]	Ye Q Y, Yang C, Chong Y H. Improved frequency response measurement method of half-wave voltage for phase modulator. Optik, 2014, 125(2), 745 doi: 10.1016/j.ijleo.2013.07.042
[9]	Rideout W, Eichen E, Schlafer J, et al. Relative intensity noise in semiconductor optical amplifiers. IEEE Photon Technol Lett, 1989, 1(12), 438 doi: 10.1109/68.46042
[10]	Eichen E, Schlafer J, Rideout W, et al. Wide-bandwidth receiver photodetector frequency response measurements using amplified spontaneous emission from a semiconductor optical amplifier. J Lightwave Technol, 1990, 8(6), 912 doi: 10.1109/50.54509
[11]	Xie F Z, Kuhl D, Böttcher E H, et al. Wide-band frequency response measurements of photodetectors using low-level photocurrent noise detection. J Appl Phys, 1993, 73(12), 8641 doi: 10.1063/1.353397
[12]	Baney D M, Sorin W V, Newton S A. High-frequency photodiode characterization using a filtered intensity noise technique. IEEE Photon Technol Lett, 1994, 6(10), 1258 doi: 10.1109/68.329656
[13]	Shao Y, Gallawa R L. Fiber bandwidth measurement using pulse spectrum analysis. Appl Opt, 1986, 25(7), 1069 doi: 10.1364/AO.25.001069
[14]	Hawkins R T, Jones M D, Pepper S H, et al. Comparison of fast photodetector response measurements by optical heterodyne and pulse response techniques. J Lightwave Technol, 1991, 9(10), 1289 doi: 10.1109/50.90926
[15]	Wang L X, Zhu N H, Ke J H, et al. Improved peak power method for measuring frequency responses of photodetectors in a self-heterodyne system. Microw Opt Technol Lett, 2010, 52(10), 2199 doi: 10.1002/mop.25448
[16]	Miao A, Huang Y Q, Huang H, et al. Wideband calibration of photodetector frequency response based on optical heterodyne measurement. Microw Opt Technol Lett, 2009, 51(1), 44 doi: 10.1002/mop.23957
[17]	Koch C. Measuring the photodetector frequency response for ultrasonic applications by a heterodyne system with difference-frequency servo control. IEEE T Ultrason Ferr, 2010, 57(5), 1169 doi: 10.1109/TUFFC.2010/1529
[18]	Dennis T, Hale P D. High-accuracy photoreceiver frequency response measurements at 1.55 µm by use of a heterodyne phase-locked loop. Opt Express, 2011, 19(21), 20103 doi: 10.1364/OE.19.020103
[19]	Feng X J, Yang P, He L B, et al. Heterodyne system for measuring frequency response of photodetectors in ultrasonic applications. IEEE Photon Technol Lett, 2016, 28(12), 1360 doi: 10.1109/LPT.2016.2542839
[20]	Hale P D, Williams D F. Calibrated measurement of optoelectronic frequency response. IEEE Trans Microw Theory Tech, 2003, 51(4), 1422 doi: 10.1109/TMTT.2003.809186
[21]	Wu X M, Man J W, Xie L, et al. Novel method for frequency response measurement of optoelectronic devices. IEEE Photon Technol Lett, 2012, 24(7), 575 doi: 10.1109/LPT.2012.2183122
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High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling

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High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling

DOI: 10.1088/1674-4926/42/4/042303

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High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling

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High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling

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