Chin. J. Semicond. > 1998, Volume 19 > Issue 6 > 472-476
|

CONTENTS

退火处理对氧化锌透明导电膜的结构及电学特性的影响

马瑾 , 计峰 , 李淑英 and 马洪磊

+ Author Affiliations

PDF

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 2518 Times PDF downloads: 2057 Times Cited by: 0 Times

    History

    Received: 18 August 2015 Revised: Online: Published: 01 June 1998

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 1998  >  19(6): 472-476
      马瑾, 计峰, 李淑英, 马洪磊. 退火处理对氧化锌透明导电膜的结构及电学特性的影响[J]. 半导体学报(英文版), 1998, 19(6): 472-476.
      Citation:
      马瑾, 计峰, 李淑英, 马洪磊. 退火处理对氧化锌透明导电膜的结构及电学特性的影响[J]. 半导体学报(英文版), 1998, 19(6): 472-476.
      shu

      • Received Date: 2015-08-18

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return