Impactof Device Architecture on Performance and Reliability of Deep Submicron SOI MOSFETs( invited paper)

F.Balestra

+ Author Affiliations

Key words: MOSFETs

Search

GET CITATION

shu

Export: BibTex EndNote

Article Metrics

Article views: 1997 Times PDF downloads: 1288 Times Cited by: 0 Times

History

Received: 20 August 2015 Revised: Online: Published: 01 October 2000

Article Navigation > Journal of Semiconductors > 2000 > 21(10): 937-954

F.Balestra. Impactof Device Architecture on Performance and Reliability of Deep Submicron SOI MOSFETs( invited paper)[J]. 半导体学报(英文版), 2000, 21(10): 937-954.

Citation:

F.Balestra. Impactof Device Architecture on Performance and Reliability of Deep Submicron SOI MOSFETs( invited paper)[J]. 半导体学报(英文版), 2000, 21(10): 937-954.

F.Balestra. Impactof Device Architecture on Performance and Reliability of Deep Submicron SOI MOSFETs( invited paper)[J]. 半导体学报(英文版), 2000, 21(10): 937-954.

Citation:

F.Balestra. Impactof Device Architecture on Performance and Reliability of Deep Submicron SOI MOSFETs( invited paper)[J]. 半导体学报(英文版), 2000, 21(10): 937-954.

PDF( 3732 KB)