Chin. J. Semicond. > 2003, Volume 24 > Issue 8 > 809-812
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SOI MOSFET的失真行为(英文)

张国艳 , 黄如 , 张兴 and 王阳元

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Key words: 失真行为, 幂级数, SOI MOSFET

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    Received: 20 August 2015 Revised: Online: Published: 01 August 2003

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      Article Navigation >  Journal of Semiconductors  > 2003  >  24(8): 809-812
      张国艳, 黄如, 张兴, 王阳元. SOI MOSFET的失真行为(英文)[J]. 半导体学报(英文版), 2003, 24(8): 809-812.
      Citation:
      张国艳, 黄如, 张兴, 王阳元. SOI MOSFET的失真行为(英文)[J]. 半导体学报(英文版), 2003, 24(8): 809-812.
      shu

      • Received Date: 2015-08-20

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