Chin. J. Semicond. > 1996, Volume 17 > Issue 12 > 898-901
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半导体激光器超短光脉冲测试技术

于虹，朱利，张明德，杨祥林

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    Received: 18 August 2015 Revised: Online: Published: 01 December 1996

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      Article Navigation >  Journal of Semiconductors  > 1996  >  17(12): 898-901
      于虹，朱利，张明德，杨祥林. 半导体激光器超短光脉冲测试技术[J]. 半导体学报(英文版), 1996, 17(12): 898-901.
      Citation:
      于虹，朱利，张明德，杨祥林. 半导体激光器超短光脉冲测试技术[J]. 半导体学报(英文版), 1996, 17(12): 898-901.
      shu

      • Received Date: 2015-08-18

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