Chin. J. Semicond. > 2000, Volume 21 > Issue 2 > 169-173
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电子辐照下的SiC少子寿命退化模型

尚也淳 , 张义门 and 张玉明

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Key words: 寿命退化模型, SiC, 电子辐照

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    Received: 20 August 2015 Revised: Online: Published: 01 February 2000

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      Article Navigation >  Journal of Semiconductors  > 2000  >  21(2): 169-173
      尚也淳, 张义门, 张玉明. 电子辐照下的SiC少子寿命退化模型[J]. 半导体学报(英文版), 2000, 21(2): 169-173.
      Citation:
      尚也淳, 张义门, 张玉明. 电子辐照下的SiC少子寿命退化模型[J]. 半导体学报(英文版), 2000, 21(2): 169-173.
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      • Received Date: 2015-08-20

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