Chin. J. Semicond. > 1983, Volume 4 > Issue 5 > 432-438
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AES深度分布测量的精确分析和电子逃逸深度的测定

邢益荣 and W.Ranke

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    Received: 20 August 2015 Revised: Online: Published: 01 May 1983

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      Article Navigation >  Journal of Semiconductors  > 1983  >  4(5): 432-438
      邢益荣, W.Ranke. AES深度分布测量的精确分析和电子逃逸深度的测定[J]. 半导体学报(英文版), 1983, 4(5): 432-438.
      Citation:
      邢益荣, W.Ranke. AES深度分布测量的精确分析和电子逃逸深度的测定[J]. 半导体学报(英文版), 1983, 4(5): 432-438.
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      • Received Date: 2015-08-20

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