Citation: |
Li Dayong, Liu Ming, Wei Wang. Driving Circuit for AMOLED with Fault Tolerance[J]. Journal of Semiconductors, 2007, 28(9): 1337-1340.
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Li D Y, Liu M, Wei W. Driving Circuit for AMOLED with Fault Tolerance[J]. Chin. J. Semicond., 2007, 28(9): 1337.
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Driving Circuit for AMOLED with Fault Tolerance
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Abstract
The defects of an OLED-based display,mainly electrical shorts,cause pixels to stay dark,decrease the brightness of a panel,severely influence the display uniformity,and also consume a considerable amount of power.In this paper,for AM-OLEDs,a novel circuit employing p-type low-temperature poly-Si thin-film transistors is introduced to offer fault-tolerant capabilities for such defects.The results show that this circuit can save significant power and maintain the luminance of the pixel without changing the driving current. -
References
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