Chin. J. Semicond. > 1992, Volume 13 > Issue 11 > 704-708
|

CONTENTS

硅中碳含量的低温红外光谱测量和碳带的温度特性

何秀坤 , 王琴 , 李光平 , 阎萍 , 汝琼娜 and 李晓波

+ Author Affiliations

PDF

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 2373 Times PDF downloads: 1210 Times Cited by: 0 Times

    History

    Received: 19 August 2015 Revised: Online: Published: 01 November 1992

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 1992  >  13(11): 704-708
      何秀坤, 王琴, 李光平, 阎萍, 汝琼娜, 李晓波. 硅中碳含量的低温红外光谱测量和碳带的温度特性[J]. 半导体学报(英文版), 1992, 13(11): 704-708.
      Citation:
      何秀坤, 王琴, 李光平, 阎萍, 汝琼娜, 李晓波. 硅中碳含量的低温红外光谱测量和碳带的温度特性[J]. 半导体学报(英文版), 1992, 13(11): 704-708.
      shu

      • Received Date: 2015-08-19

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return