An Improved Charge Pumping Method to Study Distribution of Trapped Charges in SONOS Memory

Sun Lei , Pang Huiqing , Pan Liyang and and Zhu Jun

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Key words: flash memory, SONOS, charge trapping memory, charge pumping method, charge distribution

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Received: 19 August 2015 Revised: Online: Published: 01 October 2005

Article Navigation > Journal of Semiconductors > 2005 > 26(10): 1886-1891

Sun Lei, Pang Huiqing, Pan Liyang, and Zhu Jun. An Improved Charge Pumping Method to Study Distribution of Trapped Charges in SONOS Memory[J]. 半导体学报(英文版), 2005, 26(10): 1886-1891.

Citation:

Sun Lei, Pang Huiqing, Pan Liyang, and Zhu Jun. An Improved Charge Pumping Method to Study Distribution of Trapped Charges in SONOS Memory[J]. 半导体学报(英文版), 2005, 26(10): 1886-1891.

Sun Lei, Pang Huiqing, Pan Liyang, and Zhu Jun. An Improved Charge Pumping Method to Study Distribution of Trapped Charges in SONOS Memory[J]. 半导体学报(英文版), 2005, 26(10): 1886-1891.

Citation:

Sun Lei, Pang Huiqing, Pan Liyang, and Zhu Jun. An Improved Charge Pumping Method to Study Distribution of Trapped Charges in SONOS Memory[J]. 半导体学报(英文版), 2005, 26(10): 1886-1891.

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