Chin. J. Semicond. > 1999, Volume 20 > Issue 6 > 510-514
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VLSI Design Debug Using Focused Ion Beam Technology

Chang and Xu

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    Received: 20 August 2015 Revised: Online: Published: 01 June 1999

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      Article Navigation >  Journal of Semiconductors  > 1999  >  20(6): 510-514
      Chang, Xu. VLSI Design Debug Using Focused Ion Beam Technology[J]. 半导体学报(英文版), 1999, 20(6): 510-514.
      Citation:
      Chang, Xu. VLSI Design Debug Using Focused Ion Beam Technology[J]. 半导体学报(英文版), 1999, 20(6): 510-514.
      shu

      • Received Date: 2015-08-20

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