Chin. J. Semicond. > 1999, Volume 20 > Issue 1 > 58-61
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分子束外延GaN/GaAs立方相异质结构的电子显微分析

韩培德 , 杨海峰 , 杨辉 , 林耀望 , 张泽 , 李新峰 and 周增圻

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    Received: 20 August 2015 Revised: Online: Published: 01 January 1999

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      Article Navigation >  Journal of Semiconductors  > 1999  >  20(1): 58-61
      韩培德, 杨海峰, 杨辉, 林耀望, 张泽, 李新峰, 周增圻. 分子束外延GaN/GaAs立方相异质结构的电子显微分析[J]. 半导体学报(英文版), 1999, 20(1): 58-61.
      Citation:
      韩培德, 杨海峰, 杨辉, 林耀望, 张泽, 李新峰, 周增圻. 分子束外延GaN/GaAs立方相异质结构的电子显微分析[J]. 半导体学报(英文版), 1999, 20(1): 58-61.
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      • Received Date: 2015-08-20

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