| Citation: |
Pan Shujuan, Zhong Jie. Principle,Practice,and Failure Analysis of IC Test Based on ATE[J]. Journal of Semiconductors, 2006, 27(S1): 354-357.
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Pan S J, Zhong J. Principle,Practice,and Failure Analysis of IC Test Based on ATE[J]. Chin. J. Semicond., 2006, 27(13): 354.
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Principle,Practice,and Failure Analysis of IC Test Based on ATE
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Abstract
This paper introduces the principle and method of IC test,including the electronic and functional characteristics.This paper also introduces the failure analysis based on the ZSX01,which is a typical circuit,referring to scan test.-
Keywords:
- ATE,
- DC/AC test,
- function test,
- scan test
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References
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Proportional views
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