Chin. J. Semicond. > 2001, Volume 22 > Issue 6 > 715-720
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晶格热振动对极性半导体膜中电子-表面声子强耦合极化子自陷能的影响

额尔敦朝鲁 , 李树深 and 肖景林

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Key words: 电子-声子强耦合, 极化子, 自陷能, 温度依赖性

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    Received: 20 August 2015 Revised: Online: Published: 01 June 2001

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      Article Navigation >  Journal of Semiconductors  > 2001  >  22(6): 715-720
      额尔敦朝鲁, 李树深, 肖景林. 晶格热振动对极性半导体膜中电子-表面声子强耦合极化子自陷能的影响[J]. 半导体学报(英文版), 2001, 22(6): 715-720.
      Citation:
      额尔敦朝鲁, 李树深, 肖景林. 晶格热振动对极性半导体膜中电子-表面声子强耦合极化子自陷能的影响[J]. 半导体学报(英文版), 2001, 22(6): 715-720.
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      • Received Date: 2015-08-20

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