J. Semicond. > 2008, Volume 29 > Issue 4 > 645-649

LETTERS

An SIT-BJT Operation Model for SITh in the Blocking State

Yang Jianhong, Wang Zaixing and Li Siyuan

+ Author Affiliations

PDF

Abstract: A SIT-BJT model is proposed for static induction thyristors (SITh) operation in the blocking state.On the basis of the physical mechanism,this model is presented analytically in terms of governing equations that link the electrical parameters to the structural parameters.The model is verified by numerical simulation and theoretical analysis.Based on the model,the variations of the electrical parameters such as the potential barrier,the anode junction voltage drop,and the current amplification factor are studied and discussed.

Key words: static induction thyristorSIT-BJT modelcurrent amplification factor

1

Direct tunneling gate current model for symmetric double gate junctionless transistor with SiO2/high-k gate stacked dielectric

S. Intekhab Amin, R. K. Sarin

Journal of Semiconductors, 2016, 37(3): 034001. doi: 10.1088/1674-4926/37/3/034001

2

Scaling relation of domain competition on (2+1)-dimensional ballistic deposition model with surface diffusion

Kenyu Osada, Hiroyasu Katsuno, Toshiharu Irisawa, Yukio Saito

Journal of Semiconductors, 2016, 37(9): 092001. doi: 10.1088/1674-4926/37/9/092001

3

Modeling the drain current and its equation parameters for lightly doped symmetrical double-gate MOSFETs

Mini Bhartia, Arun Kumar Chatterjee

Journal of Semiconductors, 2015, 36(4): 044003. doi: 10.1088/1674-4926/36/4/044003

4

A susceptor with a Λ-shaped slot in a vertical MOCVD reactor by induction heating

Zhiming Li, Hailing Li, Xiaobing Gan, Haiying Jiang, Jinping Li, et al.

Journal of Semiconductors, 2014, 35(9): 092003. doi: 10.1088/1674-4926/35/9/092003

5

Analytical model for subthreshold current and subthreshold swing of short-channel double-material-gate MOSFETs with strained-silicon channel on silicon-germanium substrates

Pramod Kumar Tiwari, Gopi Krishna Saramekala, Sarvesh Dubey, Anand Kumar Mukhopadhyay

Journal of Semiconductors, 2014, 35(10): 104002. doi: 10.1088/1674-4926/35/10/104002

6

The expression correction of transistor current gain and its application in reliability assessment

Haochun Qi, Xiaoling Zhang, Xuesong Xie, Li Zhao, Chengju Chen, et al.

Journal of Semiconductors, 2014, 35(9): 094008. doi: 10.1088/1674-4926/35/9/094008

7

Physical effect of carrier distribution in the channel of static induction thyristor

Chunjuan Liu, Zaixing Wang, Yongshun Wang

Journal of Semiconductors, 2014, 35(8): 084005. doi: 10.1088/1674-4926/35/8/084005

8

On-current modeling of short-channel double-gate (DG) MOSFETs with a vertical Gaussian-like doping profile

Sarvesh Dubey, Kumar Tiwari, S. Jit

Journal of Semiconductors, 2013, 34(5): 054001. doi: 10.1088/1674-4926/34/5/054001

9

Modeling and simulation of centroid and inversion charge density in cylindrical surrounding gate MOSFETs including quantum effects

P. Vimala, N. B. Balamurugan

Journal of Semiconductors, 2013, 34(11): 114001. doi: 10.1088/1674-4926/34/11/114001

10

A 2DEG charge density based drain current model for various Al and In molefraction mobility dependent nano-scale AlInGaN/AlN/GaN HEMT devices

Godwin Raj, Hemant Pardeshi, Sudhansu Kumar Pati, N Mohankumar, Chandan Kumar Sarkar, et al.

Journal of Semiconductors, 2013, 34(4): 044002. doi: 10.1088/1674-4926/34/4/044002

11

Gate leakage current reduction in IP3 SRAM cells at 45 nm CMOS technology for multimedia applications

R. K. Singh, Neeraj Kr. Shukla, Manisha Pattanaik

Journal of Semiconductors, 2012, 33(5): 055001. doi: 10.1088/1674-4926/33/5/055001

12

Analytical modeling of drain current and RF performance for double-gate fully depleted nanoscale SOI MOSFETs

Rajiv Sharma, Sujata Pandey, Shail Bala Jain

Journal of Semiconductors, 2012, 33(2): 024001. doi: 10.1088/1674-4926/33/2/024001

13

Dependence of transient performance on potential distribution in a static induction thyristor channel

Liu Chunjuan, Liu Su, Bai Yajie

Journal of Semiconductors, 2012, 33(4): 044009. doi: 10.1088/1674-4926/33/4/044009

14

Exponential dependence of potential barrier height on biased voltages of inorganic/organic static induction transistor

Zhang Yong, Yang Jianhong, Cai Xueyuan, Wang Zaixing

Journal of Semiconductors, 2010, 31(4): 044002. doi: 10.1088/1674-4926/31/4/044002

15

A new static induction thyristor with high forward blocking voltage and excellent switching performances

Zhang Caizhen, Wang Yongshun, Liu Chunjuan, Wang Zaixing

Journal of Semiconductors, 2010, 31(3): 034005. doi: 10.1088/1674-4926/31/3/034005

16

Finite element analysis of the temperature field in a vertical MOCVD reactor by induction heating

Li Zhiming, Xu Shengrui, Zhang Jincheng, Chang Yongming, Ni Jingyu, et al.

Journal of Semiconductors, 2009, 30(11): 113004. doi: 10.1088/1674-4926/30/11/113004

17

A New CMOS Image Sensor with a High Fill Factor and the Dynamic Digital Double Sampling Technique

Liu Yu, Wang Guoyu

Chinese Journal of Semiconductors , 2006, 27(2): 313-317.

18

Two-Dimensional Static Numerical Modeling and Simulation of AlGaN/GaN HEMT

Xue Lijun, Xia Yang, Liu Ming, Wang Yan, Shao Xue, et al.

Chinese Journal of Semiconductors , 2006, 27(2): 298-303.

19

Space Charges Effect of Static Induction Transistor

Chen Jinhuo, Liu Su, Wang Yongshun, Li Siyuan, and Zhang Fujia, et al.

Chinese Journal of Semiconductors , 2005, 26(3): 423-428.

20

Analysis on Characteristic of Static Induction Transistor Using Mirror Method

Hu Dongqing, Li Siyuan,and Wang Yongshun

Chinese Journal of Semiconductors , 2005, 26(2): 258-265.

  • Search

    Advanced Search >>

    GET CITATION

    Yang Jianhong, Wang Zaixing, Li Siyuan. An SIT-BJT Operation Model for SITh in the Blocking State[J]. Journal of Semiconductors, 2008, 29(4): 645-649.
    Yang J H, Wang Z X, Li S Y. An SIT-BJT Operation Model for SITh in the Blocking State[J]. J. Semicond., 2008, 29(4): 645.
    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 3046 Times PDF downloads: 1032 Times Cited by: 0 Times

    History

    Received: 18 August 2015 Revised: 30 November 2007 Online: Published: 01 April 2008

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Yang Jianhong, Wang Zaixing, Li Siyuan. An SIT-BJT Operation Model for SITh in the Blocking State[J]. Journal of Semiconductors, 2008, 29(4): 645-649. ****Yang J H, Wang Z X, Li S Y. An SIT-BJT Operation Model for SITh in the Blocking State[J]. J. Semicond., 2008, 29(4): 645.
      Citation:
      Yang Jianhong, Wang Zaixing, Li Siyuan. An SIT-BJT Operation Model for SITh in the Blocking State[J]. Journal of Semiconductors, 2008, 29(4): 645-649. ****
      Yang J H, Wang Z X, Li S Y. An SIT-BJT Operation Model for SITh in the Blocking State[J]. J. Semicond., 2008, 29(4): 645.

      An SIT-BJT Operation Model for SITh in the Blocking State

      • Received Date: 2015-08-18
      • Accepted Date: 2007-10-14
      • Revised Date: 2007-11-30
      • Published Date: 2008-04-03

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return