Citation: |
Liu Yongpan, Yang Huazhong, Wang Hui. A Thermal-Conscious Integrated Circuit Power Model and Its Impact on Dynamic Voltage Scaling Techniques[J]. Journal of Semiconductors, 2007, 28(4): 530-536.
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Liu Y P, Yang H Z, Wang H. A Thermal-Conscious Integrated Circuit Power Model and Its Impact on Dynamic Voltage Scaling Techniques[J]. Chin. J. Semicond., 2007, 28(4): 530.
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A Thermal-Conscious Integrated Circuit Power Model and Its Impact on Dynamic Voltage Scaling Techniques
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Abstract
We propose a novel thermal-conscious power model for integrated circuits that can accurately predict power and temperature under voltage scaling.Experimental results show that the leakage power consumption is underestimated by 52% if thermal effects are omitted.Furthermore,an inconsistency arises when energy and temperature are simultaneously optimized by dynamic voltage scaling.Temperature is a limiting factor for future integrated circuits,and the thermal optimization approach can attain a temperature reduction of up to 12℃ with less than 1.8% energy penalty compared with the energy optimization one.-
Keywords:
- CMOS integrated circuits,
- power model,
- temperature,
- DVS
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References
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Proportional views