Chin. J. Semicond. > 1995, Volume 16 > Issue 1 > 42-47
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外延层组分界面状况的X射线双晶衍射测定

朱南昌，李润身，陈京一，许顺生

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    Received: 19 August 2015 Revised: Online: Published: 01 January 1995

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      Article Navigation >  Journal of Semiconductors  > 1995  >  16(1): 42-47
      朱南昌，李润身，陈京一，许顺生. 外延层组分界面状况的X射线双晶衍射测定[J]. 半导体学报(英文版), 1995, 16(1): 42-47.
      Citation:
      朱南昌，李润身，陈京一，许顺生. 外延层组分界面状况的X射线双晶衍射测定[J]. 半导体学报(英文版), 1995, 16(1): 42-47.
      shu

      • Received Date: 2015-08-19

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