| Citation: |
Li Yuntao, Yu Jinzhong, Li ZhiYang, Chen Shaowu. High-Reliability 16×16 SOI Thermo-Optic Switch Matrix’[J]. Journal of Semiconductors, 2007, 28(S1): 513-515.
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Li Y T, Yu J Z, Li Z Y, Chen S W. High-Reliability 16×16 SOI Thermo-Optic Switch Matrix’[J]. Chin. J. Semicond., 2007, 28(S1): 513.
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High-Reliability 16×16 SOI Thermo-Optic Switch Matrix’
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Abstract
A driving circuit is designed on the basis of analyzing of the influences of heaters on the reliability of 16×16 SOI thermo-optic switch matrix.And the reliability of the device improves from 34.9％ to 92.30％，assuming the probability of destroyed heaters is 5％.At the same time，the I/O ports after package decreases from 34 to 10. Based on the new driving cir cur.a high-reliability 16×16 SOl thermo-optic switch matrix is designed.-
Keywords:
- thermo-optic switch matrix,
- driving circuit,
- reliability
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References
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Proportional views
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